Determination in Vacuum of the Optical Constants of Evaporated Aluminum Films PDF Download
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Author: Thomas French Sincock
Publisher:
ISBN:
Category : Aluminum films
Languages : en
Pages : 140
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Book Description
Author: Thomas French Sincock
Publisher:
ISBN:
Category : Aluminum films
Languages : en
Pages : 140
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Book Description
Author: Otakar Pelvin Prachar
Publisher:
ISBN:
Category : Reflection (Optics)
Languages : en
Pages : 64
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1278
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Book Description
Author: Chen-Hau Lin
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 200
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Book Description
Author:
Publisher: Academic Press
ISBN: 0080864708
Category : Technology & Engineering
Languages : en
Pages : 445
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Book Description
Solid State Physics
Author: Albert Feldman
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 300
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Book Description
Author: K. F. Palmer
Publisher:
ISBN:
Category :
Languages : en
Pages : 60
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Book Description
In this report, a new subtractive Kramers-Kronig computer program is described which can obtain accurate optical constants of a uniform thin film on a thick substrate using only the transmittance measurements of a single-film thickness. Preliminary results from existing data show that the optical properties of a dielectric film may depend, to a small degree, upon the thickness of the film. This effect seems to be more noticeable in films containing molecules, such as H2O and NH3, which readily form hydrogen bonds. Also described are two methods for extracting the optical constants of a dielectric thin film from measurements of the reflectance of a beam incident in a vacuum upon a film layer on a metal substrate. In one method, the dependence is observed of the reflectances of several thicknesses of the same film material upon its thickness. This method contains the assumption that the optical properties of a film material do not vary with changes in film thickness. The second method does not depend on this assumption. It uses the reflectance spectrum of a single-film thickness to compute the optical constants of the film from a dispersion relation.
Author: W. G. Parker
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Samuel C. Mauk
Publisher:
ISBN:
Category :
Languages : en
Pages : 89
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Book Description
A specially designed ellipsometer was set up, aligned and calibrated. Using this equipment, air measurements were made on thin vacuum prepared films of tantalum, aluminum, and gold and the complex optical constants of these samples were calculated. Measurements were also made on thin films of anodized tantalum oxide, anodized aluminum oxide, sputtered aluminum oxide, and evaporated sapphire (Al2O3). The refractive index and thickness of each oxide film were calculated using the exact Drude equations. A comparison of the results with published values indicated good agreement, but a general trend of increasing refractive index with film thickness was noted for tantalum oxide and an opposite trend was noted for both anodized aluminum oxide and evaporated sapphire. Suggested improvements include more care in sample preparation and some minor equipment and procedure modifications. (Author).
Author: Edward D. Palik
Publisher: Academic Press
ISBN: 0125444230
Category : Science
Languages : en
Pages : 1019
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Book Description
This is the third volume of the very successful set. This updated volume will contain non-linear properties of some of the most useful materials as well as chapters on optical measurement techniques. Contributors have decided the best values for n and k References in each critique allow the reader to go back to the original data to examine and understand where the values have come from Allows the reader to determine if any data in a spectral region needs to be filled in Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant
