Author: William Joseph Campbell
Publisher:
ISBN:
Category : Trace elements
Languages : en
Pages : 38

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Author: George A. Morton
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 1032

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Book Description
V.1. Radiation - principal authors, Robert J. Budnitz ... [et al] ; editorial c ommittee, George A. Morton ... [et al]. v.2. Water - principal authors, Mary S. Wuniby-Hunt, Ralp D. McLaughlin, Alexandre T. Quintanilha ; editors, A.E. Gree nberg, G.A. Morton.

Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897

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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Author: Martin B. Cavanagh
Publisher:
ISBN:
Category : Naval research
Languages : en
Pages : 4

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Author: DK. Moyer
Publisher:
ISBN:
Category : Alloys
Languages : en
Pages : 6

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Author: W. H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1468433814
Category : Science
Languages : en
Pages : 319

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Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and dis seminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the ac tivity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volume were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 22 (thesis year 1977) a total of 10,658 theses titles from 28 Canadian and 227 United States universities. We are sure that this broader base for theses titles reported will greatly enhance the value of this important annual reference work. While Volume 22 reports theses submitted in 1977, on occasion, certain universities do report theses submitted in previous years but not reported at the time.

Author: Charles W. Clark
Publisher:
ISBN:
Category : Trace elements
Languages : en
Pages : 36

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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1250

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Author: Eva Margui
Publisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 149

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Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

Author: R. Tertian
Publisher: John Wiley & Sons
ISBN:
Category : Education
Languages : en
Pages : 412

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