Design, Analysis and Test of Logic Circuits Under Uncertainty PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Design, Analysis and Test of Logic Circuits Under Uncertainty PDF full book. Access full book title Design, Analysis and Test of Logic Circuits Under Uncertainty by Smita Krishnaswamy. Download full books in PDF and EPUB format.
Author: Smita Krishnaswamy
Publisher: Springer Science & Business Media
ISBN: 9048196434
Category : Technology & Engineering
Languages : en
Pages : 130
Get Book Here
Book Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Author: Smita Krishnaswamy
Publisher: Springer Science & Business Media
ISBN: 9048196434
Category : Technology & Engineering
Languages : en
Pages : 130
Get Book Here
Book Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Author: Kanupriya Gulati
Publisher: Springer Science & Business Media
ISBN: 1441975187
Category : Technology & Engineering
Languages : en
Pages : 423
Get Book Here
Book Description
This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 464
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 398
Get Book Here
Book Description
Author: W. W. Youden
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 392
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Computer science
Languages : en
Pages : 1164
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 912
Get Book Here
Book Description
Author: Parag K. Lala
Publisher: Springer Nature
ISBN: 303179785X
Category : Technology & Engineering
Languages : en
Pages : 99
Get Book Here
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Masakazu Shoji
Publisher: Princeton University Press
ISBN: 1400862841
Category : Mathematics
Languages : en
Pages : 589
Get Book Here
Book Description
CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These editions preserve the original texts of these important books while presenting them in durable paperback and hardcover editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 526
Get Book Here
Book Description
