Defects in PN Junctions and MOS Capacitors Observed Using Thermally Simulated Current and Capacitance Measurements--video Script PDF Download
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Author: Martin G. Buehler
Publisher:
ISBN:
Category : Capacitors
Languages : en
Pages : 28
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Book Description
Author: Martin G. Buehler
Publisher:
ISBN:
Category : Capacitors
Languages : en
Pages : 28
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Book Description
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 60
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Book Description
Author: United States. Department of Commerce
Publisher:
ISBN:
Category : Commerce
Languages : en
Pages : 88
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Book Description
Author: United States. Department of Commerce. Library
Publisher:
ISBN:
Category : United States
Languages : en
Pages : 92
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Book Description
Author: Hubert Kaeslin
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
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Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author: D. Keith Bowen
Publisher: CRC Press
ISBN: 1420005650
Category : Technology & Engineering
Languages : en
Pages : 297
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Book Description
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Author: D. Wolf
Publisher: Springer Science & Business Media
ISBN: 3642876404
Category : Science
Languages : en
Pages : 344
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Book Description
Noise in physical systems - as a consequence of the corpuscular nature of matter - conveys information about microscopic mechanisms determining the macroscopic behavior of the system. Besides being a source of information, noise also represents a source of annoying disturbances which affect information transMission along a physical system. Therefore, noise analysis can promote our insight into the behavior of a physical system, as well as our knowledge of the natural constraints imposed upon physical-information transmission channels and devices. In recent years the continuous scientific and technical interest in noise problems has led to a remarkable progress in the understanding of noise phenomena. This progress is reflected by the rich material presented at the Fifth International Conference on Noise in Physical Systems. The conference papers originally published in these proceedings cover the various aspects of today's noise research in the fields of solid-state devices, l/f-noise, magnetic and superconducting materials, measuring methods, and theory of fluctuations. Each session of the conference was introduced by one or two invited review lectures which are included in these proceedings in full length. The 12 invited papers and more than 40 contributed papers on specific topics (only three of them have been omitted from the proceedings since they will be published elsewhere) provide a comprehensive survey of the current state-of-the-art and recent advances of noise analysis.
Author: Rolf E. Hummel
Publisher: Springer
ISBN: 9401749140
Category : Technology & Engineering
Languages : en
Pages : 412
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Book Description
It is quite satisfying for an author to learn that his brainchild has been favorably accepted by students as well as by professors and thus seems to serve some useful purpose. This horizontally integrated text on the electronic properties of metals, alloys, semiconductors, insulators, ceramics, and poly meric materials has been adopted by many universities in the United States as well as abroad, probably because of the relative ease with which the material can be understood. The book has now gone through several re printing cycles (among them a few pirate prints in Asian countries). I am grateful to all readers for their acceptance and for the many encouraging comments which have been received. I have thought very carefully about possible changes for the second edition. There is, of course, always room for improvement. Thus, some rewording, deletions, and additions have been made here and there. I withstood, how ever, the temptation to expand considerably the book by adding completely new subjects. Nevertheless, a few pages on recent developments needed to be inserted. Among them are, naturally, the discussion of ceramic (high-tempera ture) superconductors, and certain elements of the rapidly expanding field of optoelectronics. Further, I felt that the readers might be interested in learning some more practical applications which result from the physical concepts which have been treated here.
Author: National Research Council
Publisher: National Academies Press
ISBN: 030914471X
Category : Education
Languages : en
Pages : 595
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Book Description
Engineering education in K-12 classrooms is a small but growing phenomenon that may have implications for engineering and also for the other STEM subjects-science, technology, and mathematics. Specifically, engineering education may improve student learning and achievement in science and mathematics, increase awareness of engineering and the work of engineers, boost youth interest in pursuing engineering as a career, and increase the technological literacy of all students. The teaching of STEM subjects in U.S. schools must be improved in order to retain U.S. competitiveness in the global economy and to develop a workforce with the knowledge and skills to address technical and technological issues. Engineering in K-12 Education reviews the scope and impact of engineering education today and makes several recommendations to address curriculum, policy, and funding issues. The book also analyzes a number of K-12 engineering curricula in depth and discusses what is known from the cognitive sciences about how children learn engineering-related concepts and skills. Engineering in K-12 Education will serve as a reference for science, technology, engineering, and math educators, policy makers, employers, and others concerned about the development of the country's technical workforce. The book will also prove useful to educational researchers, cognitive scientists, advocates for greater public understanding of engineering, and those working to boost technological and scientific literacy.
Author: Richard C. Dorf
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages :
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Book Description
