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Author: Thien-Phap Nguyen
Publisher: John Wiley & Sons
ISBN: 1394229445
Category : Technology & Engineering
Languages : en
Pages : 292
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Book Description
Defects play a key role in the physical properties of semiconductors and devices, and their identification is essential in assessing the reliability of electronic devices. Defects in Organic Semiconductors and Devices introduces the fundamental aspects of defects in organic semiconductors and devices in relation to the structure of materials and architecture of electronic components. It covers the topics of defect formation and evolution, defect measurement techniques and their adaption to organic devices, the effects of defects on the physical properties of materials and their effects on the performance and lifetime of organic devices. Identifying defects and determining their characteristics in the structure of organic devices such as OLEDs, OFETs and OPVs make it possible to better understand degradation processes and develop solutions to improve the reliability of such devices. This book is intended for researchers and students in university programs or engineering schools who are specializing in electronics, energy and materials.
Author: Thien-Phap Nguyen
Publisher: John Wiley & Sons
ISBN: 1394229445
Category : Technology & Engineering
Languages : en
Pages : 292
Get Book Here
Book Description
Defects play a key role in the physical properties of semiconductors and devices, and their identification is essential in assessing the reliability of electronic devices. Defects in Organic Semiconductors and Devices introduces the fundamental aspects of defects in organic semiconductors and devices in relation to the structure of materials and architecture of electronic components. It covers the topics of defect formation and evolution, defect measurement techniques and their adaption to organic devices, the effects of defects on the physical properties of materials and their effects on the performance and lifetime of organic devices. Identifying defects and determining their characteristics in the structure of organic devices such as OLEDs, OFETs and OPVs make it possible to better understand degradation processes and develop solutions to improve the reliability of such devices. This book is intended for researchers and students in university programs or engineering schools who are specializing in electronics, energy and materials.
Author: K. Sumino
Publisher: Elsevier
ISBN: 0444600647
Category : Technology & Engineering
Languages : en
Pages : 817
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Book Description
Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc.The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.
Author: Jonathan Rivnay
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Understanding the nature of charge transport and its limitations on device performance has guided the rational design of organic semiconductors for over a decade. This understanding has led to the development of high performance small molecule and polymeric semiconductors for applications in low-cost complementary logic circuits, displays, lighting, and solar cells. Unfortunately, the large catalog of available materials and processing variables make it difficult to outline general design rules. Specifically, in polycrystalline and semicrystalline organic semiconductors, little is understood about the structural order within a grain and between grains, and even less is known about how this structure affects the material's performance. In this thesis, characterization methods are introduced to address these issues. To understand the structural source of electronic defects, a multi-step Fourier transform X-ray line shape analysis with thorough error analysis is adapted to determine crystallite size and intra-grain cumulative disorder. For the first time, the intra-crystalline disorder in transport-relevant directions is quantitatively determined for a variety of high performing organic semiconductors. These van der Waals bonded crystallites exhibit a wide range of disorder (from
Author: Kōji Sumino
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 826
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Book Description
Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.
Author: Daniel M. Fleetwood
Publisher: CRC Press
ISBN: 1420043773
Category : Science
Languages : en
Pages : 772
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Book Description
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
Author: Jonas Kublitski
Publisher: Springer Nature
ISBN: 3030944646
Category : Technology & Engineering
Languages : en
Pages : 211
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Book Description
In recent decades, the way human beings interact with technology has been significantly transformed. In our daily life, ever fewer manually controlled devices are used, giving way to automatized houses, cars, and devices. A significant part of this technological revolution relies on signal detection and evaluation, placing detectors as core devices for further technological developments. This book introduces a versatile contribution to achieving light sensing: Organic Semiconductor Devices for Light Detection. The text is organized to guide the reader through the main concepts of light detection, followed by a introduction to the semiconducting properties of organic molecular solids. The sources of non-idealities in organic photodetectors are presented in chapter 5, and a new device concept, which aims to overcome some of the limitation discussed in the previous chapters, is demonstrated. Finally, an overview of the field is given with a selection of open points for future investigation.
Author: Edmund G. Seebauer
Publisher: Springer Science & Business Media
ISBN: 1848820593
Category : Science
Languages : en
Pages : 304
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Book Description
Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of “defect engineering”. For example, in the bulk, charging significantly affects the total concentration of defects that are available to mediate phenomena such as solid-state diffusion. Surface defects play an important role in mediating surface mass transport during high temperature processing steps such as epitaxial film deposition, diffusional smoothing in reflow, and nanostructure formation in memory device fabrication. “Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors. Features: group IV, III-V, and oxide semiconductors; intrinsic and extrinsic defects; and, point defects, as well as defect pairs, complexes and clusters.
Author: Thien-Phap Nguyen
Publisher: John Wiley & Sons
ISBN: 1119818923
Category : Technology & Engineering
Languages : en
Pages : 208
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Book Description
Due to their special properties, organic semiconductors enable the development of large-area, low-cost devices, paving the way for flexible and nomadic applications that advantageously replace those made with traditional semiconductors. This book describes the properties and deposition methods of organic semiconductors, transparent conductive materials or metals which are used in the fabrication of organic devices. The physical processes (optical, electrical and interface) that control the mechanisms in the formation and transport of the charge carriers of the materials are studied and explained in detail. Organic Electronics 1 introduces the fundamental and applied aspects of the field of organic electronics. It is intended for researchers and students in university programs or engineering schools specializing in electronics, energy and materials.
Author: Zhenan Bao
Publisher: CRC Press
ISBN: 1351837575
Category : Technology & Engineering
Languages : en
Pages : 578
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Book Description
The remarkable development of organic thin film transistors (OTFTs) has led to their emerging use in active matrix flat-panel displays, radio frequency identification cards, and sensors. Exploring one class of OTFTs, Organic Field-Effect Transistors provides a comprehensive, multidisciplinary survey of the present theory, charge transport studies, synthetic methodology, materials characterization, and current applications of organic field-effect transistors (OFETs). Covering various aspects of OFETs, the book begins with a theoretical description of charge transport in organic semiconductors at the molecular level. It then discusses the current understanding of charge transport in single-crystal devices, small molecules and oligomers, conjugated polymer devices, and charge injection issues in organic transistors. After describing the design rationales and synthetic methodologies used for organic semiconductors and dielectric materials, the book provides an overview of a variety of characterization techniques used to probe interfacial ordering, microstructure, molecular packing, and orientation crucial to device performance. It also describes the different processing techniques for molecules deposited by vacuum and solution, followed by current technological examples that employ OTFTs in their operation. Featuring respected contributors from around the world, this thorough, up-to-date volume presents both the theory behind OFETs and the latest applications of this promising technology.
Author: James H. Crawford
Publisher: Springer Science & Business Media
ISBN: 1468409042
Category : Science
Languages : en
Pages : 494
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Book Description
Volume 1 of Point Defects in Solids has as its major emphasis defects in ionic solids. Volume 2 now extends this emphasis to semiconductors. The first four chapters treat in some detail the creation, kinetic behavior, inter actions, and physical properties of both simple and composite defects in a variety of semiconducting systems. Also included, as in Vol. 1, are chapters on special topics, namely phonon-defect interactions and defects in organic crystals. Defect behavior in semiconductors has been a subject of considerable interest since the discovery some twenty-five years ago that fast neutron irradiation profoundly affected the electrical characteristics of germanium and silicon. Present-day interest has been stimulated by such semiconductor applications as solar cell power plants for space stations and satellites and semiconductor particle and y-ray detectors, since in both radiation damage can cause serious deterioration. Of even greater practical concern is the need to understand particle damage in order to capitalize upon the develop ing technique of ion implantation as a means of device fabrication. Although the periodic international conferences on radiation effects in semiconductors have served the valuable function of summarizing the extensive work being done in this field, these proceedings are much too detailed and lack the background discussion needed to make them useful to the novice.
