Characterisation and Control of Defects in Semiconductors PDF Download

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Characterisation and Control of Defects in Semiconductors

Characterisation and Control of Defects in Semiconductors PDF Author: Filip Tuomisto
Publisher: Institution of Engineering and Technology
ISBN: 1785616552
Category : Technology & Engineering
Languages : en
Pages : 601

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Book Description
Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power, and new kinds of electronics generates an ongoing need for new materials and properties, and so creates new defect-related challenges.