Journal of Research of the National Institute of Standards and Technology PDF Download
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Author:
Publisher:
ISBN:
Category : Electronic journals
Languages : en
Pages : 810
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Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Author:
Publisher:
ISBN:
Category : Electronic journals
Languages : en
Pages : 810
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Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
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Category : Geology
Languages : en
Pages : 578
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Book Description
Author: P.J. Potts
Publisher: Springer Science & Business Media
ISBN: 940153988X
Category : Science
Languages : en
Pages : 633
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Book Description
without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.
Author: Douglas H. Werner
Publisher: CRC Press
ISBN: 9814745693
Category : Science
Languages : en
Pages : 399
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Book Description
The rapid development of technology based on metamaterials coupled with the recent introduction of the transformation optics technique provides an unprecedented ability for device designers to manipulate and control the behavior of electromagnetic wave phenomena. Many of the early metamaterial designs, such as negative index materials and electromagnetic bandgap surfaces, were limited to operation only over a very narrow bandwidth. However, recent groundbreaking work reported by several international research groups on the development of broadband metamaterials has opened up the doors to an exciting frontier in the creation of new devices for applications ranging from radio frequencies to visible wavelengths. This book contains a collection of eight chapters that cover recent cutting-edge contributions to the theoretical, numerical, and experimental aspects of broadband metamaterials.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 558
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Book Description
Author: Geological Survey (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 510
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Book Description
Author: Geological Survey (U.S.)
Publisher:
ISBN:
Category : Geology
Languages : en
Pages : 476
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Book Description
Author: Kouichi Tsuji
Publisher: John Wiley & Sons
ISBN: 0470020423
Category : Science
Languages : en
Pages : 616
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Book Description
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Sudhanshu Shekhar Jha
Publisher: World Scientific
ISBN: 9789810220228
Category : Technology & Engineering
Languages : en
Pages : 962
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Book Description
Optoelectronics is a rapidly expanding field of research and development. In years to come, it is destined to play a primary role in the growing information industry. The basic philosophy behind the science and technology of optoelectronics is to create and develop photonic devices in which optical photons (light waves) instead of electronic carriers, are manipulated for the conventional task performed by microelectronics. Thanks to the availability of large bandwidth at optical frequencies, the development of cost-effective low-loss low-dispersion silica fibers for optical transmission, and the possibility of ultra-fast two-dimensional processing, the field of present-day microelectronics is moving steadily towards this new technology of optoelectronics and photonics.This volume presents reviews of different areas of optoelectronics written by international experts in the field, covering most of the topics of recent importance. It includes detailed discussions on semiconductor lasers and optical amplifiers; optical fiber transmission; photodetectors; optoelectronic and photonic integrated circuits; light-wave telecommunications; optical signal and image processing; optical computing; nonlinear and integrated optics; space-time Fourier optics; optical metrology and sensing and optical interconnects. All chapters are written in the style of a textbook containing tutorial sections which should be of great use to graduate students. The volume should serve as an excellent book for graduate level course on optoelectronics, modern optical engineering, and optical communications.
