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Author:
Publisher:
ISBN: 9783035712742
Category :
Languages : en
Pages :
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Author:
Publisher:
ISBN: 9783035712742
Category :
Languages : en
Pages :
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Author: Zainal Arifin Ahmad
Publisher: Trans Tech Publication
ISBN: 9783037855607
Category : Technology & Engineering
Languages : ms
Pages : 523
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Book Description
X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Muhamad Faiz Md Din
Publisher: Trans Tech Publications Ltd
ISBN: 3035732744
Category : Science
Languages : en
Pages : 710
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Book Description
Selected peer-reviewed full text papers from the 10th International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2021)
Author: Andreas Maier
Publisher: Springer
ISBN: 3319965204
Category : Computers
Languages : en
Pages : 263
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Book Description
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
ISBN: 1118844262
Category : Science
Languages : en
Pages : 896
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Book Description
During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
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Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1216
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Author: Iwao Matsuda
Publisher: Springer Nature
ISBN: 9819967147
Category : Science
Languages : en
Pages : 170
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Book Description
X-ray experiments have been used widely in materials science, and conventional spectroscopy has been based on linear responses in light–matter interactions. Recent development of ultrafast light sources of tabletop lasers and X-ray free electron lasers reveals nonlinear optical phenomena in the X-ray region, and the measurement signals have been found to carry a further wealth of information on materials. This book overviews such nonlinear X-ray spectroscopy and its related issues for materials science. Each chapter is written by pioneers in the field and skillfully reviews the topics of nonlinear spectroscopy including X-ray multi-photon absorption and X-ray second harmonic generation. The chapters are divided depending on photon wavelength, ranging from extreme ultraviolet to (soft) X-ray. To facilitate readers’ comprehensive understanding, some of the chapters cover the conventional linear X-ray spectroscopy and basic principles of the non-linear responses. The book is mainly accessible as a primer for junior/senior- or graduate-level readers, and it also serves as a useful reference or guide even for established researchers in optical spectroscopy. The book offers readers opportunities to benefit from cutting-edge research in this new area of nonlinear X-ray spectroscopy.
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 592
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Book Description
