Concurrent Error Detection with Latency in Sequential Circuits PDF Download
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Author: Lawrence Paul Holmquist
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
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Author: Lawrence Paul Holmquist
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
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Author: Argirios Bailas
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
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Author: Robert Aitken
Publisher:
ISBN: 9780769522418
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author:
Publisher:
ISBN:
Category : Algebra
Languages : en
Pages : 512
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Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 472
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Book Description
Author: Allen B. Tucker
Publisher: CRC Press
ISBN: 0203494458
Category : Computers
Languages : en
Pages : 2742
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Book Description
When you think about how far and fast computer science has progressed in recent years, it's not hard to conclude that a seven-year old handbook may fall a little short of the kind of reference today's computer scientists, software engineers, and IT professionals need. With a broadened scope, more emphasis on applied computing, and more than 70 chap
Author: Michael Gössel
Publisher: Springer Science & Business Media
ISBN: 140208420X
Category : Technology & Engineering
Languages : en
Pages : 186
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Book Description
Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.
Author:
Publisher: IEEE Computer Society Press
ISBN:
Category : Computers
Languages : en
Pages : 464
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Book Description
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author: Christer Fernstrom
Publisher: Springer Science & Business Media
ISBN: 9783540164456
Category : Computers
Languages : en
Pages : 760
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Book Description
After historical introduction, the aspiration technique and imaging modalities are described. Thereafter, the use of aspiration cytology in the diagnosis and mainly in the sta- ging of urologic cancers is on still not well known appli- cations of the procedure in the staging of some organs (bladder, adrenals, penis, testis and secondary ureteral strictures) are reported.
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 2092
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