Author: Arabian
Publisher: CRC Press
ISBN: 1000103684
Category : Technology & Engineering
Languages : en
Pages : 616
Book Description
Describes this process at it relates to the electronics industry, focusing on such areas as printed wiring boards, networking, automatic assembly, surface mount technology, tape automated bonding, bar coding, and electro-static discharge. Also studies the effects of group work ethics as a factor in
Computer Integrated Electronics Manufacturing and Testing
Author: Arabian
Publisher: CRC Press
ISBN: 1000103684
Category : Technology & Engineering
Languages : en
Pages : 616
Book Description
Describes this process at it relates to the electronics industry, focusing on such areas as printed wiring boards, networking, automatic assembly, surface mount technology, tape automated bonding, bar coding, and electro-static discharge. Also studies the effects of group work ethics as a factor in
Publisher: CRC Press
ISBN: 1000103684
Category : Technology & Engineering
Languages : en
Pages : 616
Book Description
Describes this process at it relates to the electronics industry, focusing on such areas as printed wiring boards, networking, automatic assembly, surface mount technology, tape automated bonding, bar coding, and electro-static discharge. Also studies the effects of group work ethics as a factor in
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Integrated Product Design and Manufacturing Using Geometric Dimensioning and Tolerancing
Author: Bob Campbell
Publisher: CRC Press
ISBN: 9780203910122
Category : Mathematics
Languages : en
Pages : 360
Book Description
This book addresses the preparation and application of design layout analyses with concurrent engineering teams in six steps that capture design intent and add value to design process. It offers tools for eliminating costly trial-and-error approaches and deliver economically viable products. The authors discuss product design techniques that allevi
Publisher: CRC Press
ISBN: 9780203910122
Category : Mathematics
Languages : en
Pages : 360
Book Description
This book addresses the preparation and application of design layout analyses with concurrent engineering teams in six steps that capture design intent and add value to design process. It offers tools for eliminating costly trial-and-error approaches and deliver economically viable products. The authors discuss product design techniques that allevi
FUNDAMENTALS OF MODERN MANUFACTURING
Author: Mikell P. Groover
Publisher: JOHN WILEY & SONS, INC.
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1028
Book Description
Publisher: JOHN WILEY & SONS, INC.
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1028
Book Description
Computer Vision for Electronics Manufacturing
Author: L.F Pau
Publisher: Springer Science & Business Media
ISBN: 1461305071
Category : Computers
Languages : en
Pages : 324
Book Description
DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.
Publisher: Springer Science & Business Media
ISBN: 1461305071
Category : Computers
Languages : en
Pages : 324
Book Description
DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.
Artificial Intelligence in Design ’92
Author: John S. Gero
Publisher: Springer Science & Business Media
ISBN: 9401127875
Category : Technology & Engineering
Languages : en
Pages : 906
Book Description
Design has now become an important research topic in engineering and architecture. Design is one of the keystones to economic competitiveness and the fundamental precursor to manufacturing. The development of computational models founded on the artificial intelligence paradigm has provided an impetus for current design research. This volume contains contributions from the Second International Conference on Artificial Intelligence in Design held in June 1992 in Pittsburgh. They represent the state-of-the-art and the cutting edge of research and development in this field. They are of particular interest to researchers, developers and users of computer systems in design. This volume demonstrates both the breadth and depth of artificial intelligence in design and points the way forward for our understanding of design as a process and for the development of computer-based tools to aiddesigners.
Publisher: Springer Science & Business Media
ISBN: 9401127875
Category : Technology & Engineering
Languages : en
Pages : 906
Book Description
Design has now become an important research topic in engineering and architecture. Design is one of the keystones to economic competitiveness and the fundamental precursor to manufacturing. The development of computational models founded on the artificial intelligence paradigm has provided an impetus for current design research. This volume contains contributions from the Second International Conference on Artificial Intelligence in Design held in June 1992 in Pittsburgh. They represent the state-of-the-art and the cutting edge of research and development in this field. They are of particular interest to researchers, developers and users of computer systems in design. This volume demonstrates both the breadth and depth of artificial intelligence in design and points the way forward for our understanding of design as a process and for the development of computer-based tools to aiddesigners.
Cumulative Book Index
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 2232
Book Description
A world list of books in the English language.
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 2232
Book Description
A world list of books in the English language.
Integrated Circuit Test Engineering
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Official Gazette of the United States Patent and Trademark Office
Author:
Publisher:
ISBN:
Category : Trademarks
Languages : en
Pages : 1414
Book Description
Publisher:
ISBN:
Category : Trademarks
Languages : en
Pages : 1414
Book Description
Artificial Intelligence in Design
Author:
Publisher:
ISBN:
Category : Artificial intelligence
Languages : en
Pages : 956
Book Description
Publisher:
ISBN:
Category : Artificial intelligence
Languages : en
Pages : 956
Book Description