Computer Image Processing for the Enhancement of Electron Micrographs

Computer Image Processing for the Enhancement of Electron Micrographs PDF Author: Kenneth Brakeley Welles
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 364

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Computer Image Processing for the Enhancement of Electron Micrographs

Computer Image Processing for the Enhancement of Electron Micrographs PDF Author: Kenneth Brakeley Welles
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 364

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Book Description


Image Analysis, Enhancement and Interpretation

Image Analysis, Enhancement and Interpretation PDF Author: D. L. Misell
Publisher:
ISBN: 9780720442502
Category : Electron microscopes
Languages : en
Pages : 305

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Practical Methods in Electron Microscopy

Practical Methods in Electron Microscopy PDF Author: D. L. Misell
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 330

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Logarithmic Image Processing: Theory and Applications

Logarithmic Image Processing: Theory and Applications PDF Author:
Publisher: Academic Press
ISBN: 0128052295
Category : Science
Languages : en
Pages : 320

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Book Description
Logarithmic Image Processing: Theory and Applications, the latest volume in the series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy and features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics. Merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy into a single volume Contains the latest information on logarithmic image processing and its theory and applications Features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics

Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy PDF Author: Earl J. Kirkland
Publisher: Springer Science & Business Media
ISBN: 1441965335
Category : Science
Languages : en
Pages : 289

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Book Description
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Biomedical Images and Computers

Biomedical Images and Computers PDF Author: J. Sklansky
Publisher: Springer Science & Business Media
ISBN: 3642932185
Category : Medical
Languages : en
Pages : 339

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Book Description
The technology of automatic pattern recognition and digital image processing, after over two decades of basic research, is now appearing in important applications in biology and medicine as weIl as industrial, military and aerospace systems. In response to a suggestion from Mr. Norman Caplan, ·the Program Director for Automation, Bioengineering and Sensing at the United States National Science Foundation, the authors of this book organized the first Uni ted States-France Seminar on Biomedical Image Processing. The seminar met at the Hotel Beau Site, St. Pierre de Chartreuse, France on May 27-31, 1980. This book contains most of the papers presented at this seminar, as weIl as two papers (by Bisconte et al. and by Ploem ~ al.) discussed at the seminar but not appearing on the program. We view the subject matter of this seminar as a confluence amon~ three broad scientific and engineering disciplines: 1) biology and medicine, 2) imaging and optics, and 3) computer science and computer engineering. The seminar had three objectives: 1) to discuss the state of the art of biomedical image processing with emphasis on four themes: microscopic image analysis, radiological image analysis, tomography, and image processing technology; 2) to place values on directions for future research so as to give guidance to agencies supporting such research; and 3) to explore and encourage various areas of cooperative research between French and Uni ted States scientists within the field of Biomedical Image Processing.

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports PDF Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 984

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Computer-Assisted Microscopy

Computer-Assisted Microscopy PDF Author: John C. Russ
Publisher: Springer Science & Business Media
ISBN: 1461305632
Category : Science
Languages : en
Pages : 461

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Book Description
The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics PDF Author:
Publisher: Academic Press
ISBN: 008057758X
Category : Technology & Engineering
Languages : en
Pages : 233

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Book Description
Advances in Imaging and Electron Physics

Transmission Electron Microscopy

Transmission Electron Microscopy PDF Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662148242
Category : Technology & Engineering
Languages : en
Pages : 595

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Book Description
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.