Annotated Accession List of Data Compilations of the Office of Standard Reference Data PDF Download
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Author: National Measurement Laboratory (U.S.). Office of Standard Reference Data
Publisher:
ISBN:
Category : Chemistry, Physical and theoretical
Languages : en
Pages : 204
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Book Description
Author: National Measurement Laboratory (U.S.). Office of Standard Reference Data
Publisher:
ISBN:
Category : Chemistry, Physical and theoretical
Languages : en
Pages : 204
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Book Description
Author: Los Alamos Scientific Laboratory
Publisher:
ISBN:
Category : Cross sections (Nuclear physics)
Languages : en
Pages : 470
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Book Description
Author: Joseph L. Fowler
Publisher:
ISBN:
Category : Cross sections (Nuclear physics)
Languages : en
Pages : 1062
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 744
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Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 800
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 362
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Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 788
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Author: William R. Shields
Publisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 662
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Book Description
Author: United States. National Bureau of Standards. Technical Information and Publications Division
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 788
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Author: Charles Barrett
Publisher: Springer Science & Business Media
ISBN: 1461399661
Category : Science
Languages : en
Pages : 582
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Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
