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Author: Christine M. Mahoney
Publisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
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Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Author: Christine M. Mahoney
Publisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
Get Book Here
Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Author: J. C. Vickerman
Publisher: IM Publications
ISBN: 1906715173
Category : Mass spectrometry
Languages : en
Pages : 742
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Book Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Author: Mike S. Lee
Publisher: John Wiley & Sons
ISBN: 1118180720
Category : Science
Languages : en
Pages : 1362
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Book Description
Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.
Author: J. C. Vickerman
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 457
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Book Description
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
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Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Author: A. Benninghoven
Publisher: Elsevier Science & Technology
ISBN:
Category : Science
Languages : en
Pages : 1092
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Book Description
Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
Author: Vincent S. Smentkowski
Publisher: Springer Science & Business Media
ISBN: 3319013602
Category : Science
Languages : en
Pages : 333
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Book Description
This book summarizes the main surface analysis techniques that are being used to study biological specimens/systems. The compilation of chapters in this book highlight the benefits that surface analysis provides. The outer layer of bulk solid or liquid samples is referred to as the surface of the sample/material. At the surface, the composition, microstructure, phase, chemical bonding, electronic states, and/or texture is often different than that of the bulk material. The outer surface is where many material interactions/reactions take place. This is especially true biomaterials which may be fabricated into bio-devices and in turn implanted into tissues and organs. Surfaces of biomaterials (synthetic or modified natural materials) are of critical importance since the surface is typically the only part of the biomaterial/bio-device that comes in contact with the biological system. Analytical techniques are required to characterize the surface of biomaterials and quantify their impact in real-world biological systems. Surface analysis of biological materials started in the 1960’s and the number of researchers working in this area have increased very rapidly since then, a number of advances have been made to standard surface analytical instrumentation, and a number of new instruments have been introduced.
Author: Vasile-Dan Hodoroaba
Publisher: Elsevier
ISBN: 0128141824
Category : Science
Languages : en
Pages : 564
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Book Description
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.
Author: J. C. Vickerman
Publisher: Oxford University Press, USA
ISBN:
Category : Business & Economics
Languages : en
Pages : 368
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Book Description
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Author: Minna Hakkarainen
Publisher: Springer Science & Business Media
ISBN: 3642280404
Category : Technology & Engineering
Languages : en
Pages : 219
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Book Description
Emerging Mass Spectrometric Tools for Analysis of Polymers and Polymer Additives, by Nina Aminlashgari and Minna Hakkarainen. Analysis of Polymer Additives and Impurities by Liquid Chromatography/Mass Spectrometry and Capillary Electrophoresis/Mass Spectrometry, by Wolfgang Buchberger and Martin Stiftinger. Direct Insertion Probe Mass Spectrometry of Polymers, by Jale Hacaloglu Mass Spectrometric Characterization of Oligo- and Polysaccharides and Their Derivatives, by Petra Mischnick. Electrospray Ionization-Mass Spectrometry for Molecular Level Understanding of Polymer Degradation, by Minna Hakkarainen.
