Chemical-Mechanical Polishing 2001 - Advances and Future Challenges: Volume 671

Chemical-Mechanical Polishing 2001 - Advances and Future Challenges: Volume 671 PDF Author: Materials Research Society. Meeting
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 312

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This volume was first published in 2001.

Chemical-Mechanical Polishing 2001 - Advances and Future Challenges: Volume 671

Chemical-Mechanical Polishing 2001 - Advances and Future Challenges: Volume 671 PDF Author: Materials Research Society. Meeting
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 312

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This volume was first published in 2001.

Chemical-Mechanical Polishing 2001 - Advances and Future Challenges:

Chemical-Mechanical Polishing 2001 - Advances and Future Challenges: PDF Author: Suryadevara V. Babu
Publisher: Cambridge University Press
ISBN: 9781107412187
Category : Technology & Engineering
Languages : en
Pages : 306

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Book Description
With copper and barrier-layer integration firmly in place, several other exciting developments are occurring in the practice of chemical-mechanical polishing (CMP), and many advances are described in this book, first published in 2001. Discussions on CMP for shallow-trench isolation, abrasive-free slurries, improvements in pad and tool configurations including fixed abrasive pads, 'engineered' particles, effects of nanotopography, end-point studies, defect characterization and novel post-CMP cleaning methods are highlighted. Considerable progress has also been reported in modeling the complicated interactions that occur between the wafer surface and the pad and the slurry, whether containing abrasives or abrasive-free, and their influence on dishing and erosion and nonuniformity. These studies offer valuable insights for process improvements and yet many challenges remain and will provide a high level of interest for future books. Topics include: recent developments - pads and related issues; CMP abrasives; copper CMP/STI and planarization; STI and planarization - wear-rate models; low-k and integration issues - particle and process effects in CMP and issues in CMP cleaning.

Chemical-mechanical Polishing

Chemical-mechanical Polishing PDF Author:
Publisher:
ISBN:
Category : Electrolytic polishing
Languages : en
Pages : 312

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Book Description


Advances in Chemical-Mechanical Polishing: Volume 816

Advances in Chemical-Mechanical Polishing: Volume 816 PDF Author: Materials Research Society. Meeting
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 318

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2004, presents advances in fundamental understanding, development, and applications of chemical-mechanical polishing (CMP).

Si Front-End Processing: Volume 669

Si Front-End Processing: Volume 669 PDF Author: Erin C. Jones
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 362

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Chemical-Mechanical Planarization: Volume 867

Chemical-Mechanical Planarization: Volume 867 PDF Author: A. Kumar
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 330

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Book Description
Technology requirements associated with the progressive scaling of devices for future technology nodes, coupled with the aggressive introduction of new materials, places tremendous demands on chemical-mechanical polishing. The goal of this 2005 book, which is part of a popular series from MRS, is to bring together experts from a broad spectrum of research and technology groups currently working on CMP, to review advances made, and to offer a comprehensive discussion of future challenges that must be overcome. The book shows trends in the development of consumables, process modules, tool designs, process integration, modeling, defect characterization, and metrology. Topics include: planarization processes and applications; consumables -CMP pads and slurries; CMP equipment and metrology; and CMP modeling and simulation.

GaN and Related Alloys - 2001: Volume 693

GaN and Related Alloys - 2001: Volume 693 PDF Author: John E. Northrup
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 912

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Surface Engineering 2001 - Fundamentals and Applications: Volume 697

Surface Engineering 2001 - Fundamentals and Applications: Volume 697 PDF Author: Wen Jin Meng
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 480

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Symposium

Symposium PDF Author: Ichirō Takeuchi
Publisher:
ISBN: 9781558996366
Category :
Languages : en
Pages : 336

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Book Description


Advances in Liquid Crystalline Materials and Technologies: Volume 709

Advances in Liquid Crystalline Materials and Technologies: Volume 709 PDF Author: Patrick T. Mather
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 328

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.