Chemical and Electrical Properties of Grain Boundaries in Polycrystalline Silicon - Primary Source Edition PDF Download
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Author: Phillip Eugene Russell
Publisher: Nabu Press
ISBN: 9781289778880
Category :
Languages : en
Pages : 190
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Book Description
This is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book.
Author: Phillip Eugene Russell
Publisher: Nabu Press
ISBN: 9781289778880
Category :
Languages : en
Pages : 190
Get Book Here
Book Description
This is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book.
Author: Yue Kuo
Publisher: Springer Science & Business Media
ISBN: 9781402075063
Category : Thin film transistors
Languages : en
Pages : 528
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Book Description
This is the first reference on amorphous silicon and polycrystalline silicon thin film transistors that gives a systematic global review of all major topics in the field. These volumes include sections on basic materials and substrates properties, fundamental device physics, critical fabrication processes (structures, a-Si: H, dielectric, metallization, catalytic CVD), and existing and new applications. The chapters are written by leading researchers who have extensive experience with reputed track records. Thin Film Transistors provides practical information on preparing individual functional a-Si: H TFTs and poly-Si TFTs as well as large-area TFT arrays. Also covered are basic theories on the a-Si: H TFT operations and unique material characteristics. Readers are also exposed to a wide range of existing and new applications in industries.
Author: H. J. Moller
Publisher:
ISBN:
Category :
Languages : en
Pages : 394
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Preliminary high resolution TEM of grain boundaries and twin boundaries in polycrystalline Si has shown that the grain boundaries may have very complicated structures. In two cases, complete spatial orientation of adjacent grains (i.e., including determination of the translation vector in the boundary) has been carried out, using the method of common reflection and lattice imaging techniques.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1572
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Book Description
Author: Mazharul Huq Chowdhury
Publisher:
ISBN:
Category :
Languages : en
Pages : 114
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Book Description
Polycrystalline materials are widely used in large area electronic devices such as flat panel x-ray image detectors, and solar cells due to their suitability to deposit over large area at low cost. The performance of polycrystalline-based flat panel detectors are showing encouraging results (good sensitivity, good resolution and acceptable dark current) and give possibility to replace existing x-ray film/screen cassette. Therefore large area polycrystalline based flat panel detectors have opened new clinical possibilities and the polycrystalline solar cells give the opportunity of manufacturing low cost photovoltaic cells. Consequently, active research has been carried out to find out suitable polycrystalline materials (e.g. HgI2, CdTe, CdZnTe, PbI2, PbO etc) for various large area applications. However a polycrystalline material is composed of micro crystallites joined together by grain boundaries (complex structure, consisting of a few atomic layers of disordered atoms) which posses trap centers for charge carriers. Therefore, grain boundaries can trap a large amount of charges during detector operation. A potential barrier for drifting carriers may exist at the grain boundary, which controls the carrier mobility. Moreover, the performance of these polycrystalline detectors are affected due to the polarization phenomena (any change in the performance of the detector after the detector biasing) under applied bias. Therefore, in this research work, an analytical model is developed to study the electrical properties (electric field and potential distributions, potential barrier height, and polarization phenomenon) of polycrystalline materials at different doping levels for detector and solar cell applications by considering an arbitrary amount of grain boundary charge and a finite width of grain boundary region. The general grain boundary model is also applicable to highly doped polycrystalline materials. The electric field and potential distributions are obtained by solving the Poisson's equation in both depleted grains and grain boundary regions. The electric field and potential distributions across the detector are analyzed under various doping, trapping and applied biases. The electric field collapses, i.e., a nearly zero average electric field region exists in some part of the biased detector at high trapped charge densities at the grain boundaries. The model explains the conditions of existence of a zero average field region, i.e., it explains the polarization mechanisms in polycrystalline materials. The potential barrier at the grain boundary exists if the electric field changes its sign at the opposite side of the grain boundary. The potential barrier does not exist in all grain boundaries in the low doped polycrystalline detector and it never exists in intrinsic polycrystalline detectors under applied bias condition provided there is no charge trapping in the grain.
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 572
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Book Description
Author:
Publisher:
ISBN:
Category : Solar energy
Languages : en
Pages : 236
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Book Description
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 578
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Book Description
Author: Pavel Lejcek
Publisher: Springer
ISBN: 9783642125041
Category : Technology & Engineering
Languages : en
Pages : 239
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Book Description
Grain boundaries are important structural components of polycrystalline materials used in the vast majority of technical applications. Because grain boundaries form a continuous network throughout such materials, their properties may limit their practical use. One of the serious phenomena which evoke these limitations is the grain boundary segregation of impurities. It results in the loss of grain boundary cohesion and consequently, in brittle fracture of the materials. The current book deals with fundamentals of grain boundary segregation in metallic materials and its relationship to the grain boundary structure, classification and other materials properties.
