Author: Helmut Liebl
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Charged Particle Optics III
Author: Eric Munro
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425775
Category : Science
Languages : en
Pages : 0
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425775
Category : Science
Languages : en
Pages : 0
Book Description
Lasers & Fiber Optics 3155/charged Particle Optics III
Author: Soc of Photo-optical
Publisher:
ISBN: 9781997003151
Category : Technology & Engineering
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781997003151
Category : Technology & Engineering
Languages : en
Pages :
Book Description
Charged Particle Optics III
Author: Eric Munro
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425775
Category : Science
Languages : en
Pages : 278
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425775
Category : Science
Languages : en
Pages : 278
Book Description
Handbook of Charged Particle Optics
Author: Jon Orloff
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Charged Particle Optics
Author: K. Ura
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Applied charged particle optics
Author: A. Septier
Publisher:
ISBN: 9780120145744
Category : Electron optics
Languages : en
Pages : 1293
Book Description
Publisher:
ISBN: 9780120145744
Category : Electron optics
Languages : en
Pages : 1293
Book Description
Charged Particle Optics
Author: International Conference on Charged Particle Optics
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 422
Book Description
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 422
Book Description
The Finite Element Method in Charged Particle Optics
Author: Anjam Khursheed
Publisher: Springer Science & Business Media
ISBN: 146155201X
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.
Publisher: Springer Science & Business Media
ISBN: 146155201X
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.
Principles of Electron Optics, Volume 3
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Charged-particle Optics
Author:
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 294
Book Description
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 294
Book Description