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Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 416
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Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 416
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Book Description
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 410
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 684
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 686
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Book Description
Author:
Publisher: National Academies
ISBN:
Category : Research grants
Languages : en
Pages : 188
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Book Description
Author: James A. Schwarz
Publisher: CRC Press
ISBN: 9780824750497
Category : Science
Languages : en
Pages : 974
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
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Book Description
Author: Hari Singh Nalwa
Publisher: CRC Press
ISBN: 0429611617
Category : Technology & Engineering
Languages : en
Pages : 896
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Book Description
The field of nonlinear optics emerged three decades ago with the development of the first operating laser and the demonstration of frequency doubling phenomena. These milestone discoveries not only generated much interest in laser science, but also set the stage for future work on nonlinear optics. This book presents an excellent overview of the exciting new advances in nonlinear optical (NLO) materials and their applications in emerging photonics technologies. It is the first reference source available to cover every NLO material published through 1995. All theoretical approaches, measurement techniques, materials, technologies, and applications are covered. With more than 1,800 bibliographic citations, 324 figures, 218 tables, and 812 equations, this book is an invaluable reference source for graduate and undergraduate students, researchers, scientists and engineers working in academia and industries in chemistry, solid-state physics, materials science, optical and polymer engineering, and computational science.
Author:
Publisher:
ISBN:
Category : Atomic spectroscopy
Languages : en
Pages : 1244
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Book Description
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
