Author: Nidal Hilal
Publisher: Elsevier
ISBN: 0444637915
Category : Science
Languages : en
Pages : 460
Book Description
Membrane Characterization provides a valuable source of information on how membranes are characterized, an extremely limited field that is confined to only brief descriptions in various technical papers available online. For the first time, readers will be able to understand the importance of membrane characterization, the techniques required, and the fundamental theory behind them. This book focuses on characterization techniques that are normally used for membranes prepared from polymeric, ceramic, and composite materials. - Features specific details on many membrane characterization techniques for various membrane materials of industrial and academic interest - Contains examples of international best practice techniques for the evaluation of several membrane parameters, including pore size, charge, and fouling - Discusses various membrane models more suitable to a specific application - Provides examples of ab initio calculations for the design, optimization, and scale-up of processes based on characterization data
Membrane Characterization
Author: Nidal Hilal
Publisher: Elsevier
ISBN: 0444637915
Category : Science
Languages : en
Pages : 460
Book Description
Membrane Characterization provides a valuable source of information on how membranes are characterized, an extremely limited field that is confined to only brief descriptions in various technical papers available online. For the first time, readers will be able to understand the importance of membrane characterization, the techniques required, and the fundamental theory behind them. This book focuses on characterization techniques that are normally used for membranes prepared from polymeric, ceramic, and composite materials. - Features specific details on many membrane characterization techniques for various membrane materials of industrial and academic interest - Contains examples of international best practice techniques for the evaluation of several membrane parameters, including pore size, charge, and fouling - Discusses various membrane models more suitable to a specific application - Provides examples of ab initio calculations for the design, optimization, and scale-up of processes based on characterization data
Publisher: Elsevier
ISBN: 0444637915
Category : Science
Languages : en
Pages : 460
Book Description
Membrane Characterization provides a valuable source of information on how membranes are characterized, an extremely limited field that is confined to only brief descriptions in various technical papers available online. For the first time, readers will be able to understand the importance of membrane characterization, the techniques required, and the fundamental theory behind them. This book focuses on characterization techniques that are normally used for membranes prepared from polymeric, ceramic, and composite materials. - Features specific details on many membrane characterization techniques for various membrane materials of industrial and academic interest - Contains examples of international best practice techniques for the evaluation of several membrane parameters, including pore size, charge, and fouling - Discusses various membrane models more suitable to a specific application - Provides examples of ab initio calculations for the design, optimization, and scale-up of processes based on characterization data
Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Approaches to the Purification, Analysis and Characterization of Antibody-Based Therapeutics
Author: Allan Matte
Publisher: Elsevier
ISBN: 0081030193
Category : Business & Economics
Languages : en
Pages : 222
Book Description
Approaches to the Purification, Analysis and Characterization of Antibody-Based Therapeutics provides the interested and informed reader with an overview of current approaches, strategies and considerations relating to the purification, analytics and characterization of therapeutic antibodies and related molecules. While there are obviously other books published in and around this subject area, they seem to be either older (c.a. year 2000 publication date) or are more limited in scope. The book will include an extensive bibliography of the published literature in the respective areas covered. It is not, however, intended to be a how-to methods book. Covers the vital new area of R&D on therapeutic antibodies Written by leading scientists and researchers Up-to-date coverage and includes a detailed bibliography
Publisher: Elsevier
ISBN: 0081030193
Category : Business & Economics
Languages : en
Pages : 222
Book Description
Approaches to the Purification, Analysis and Characterization of Antibody-Based Therapeutics provides the interested and informed reader with an overview of current approaches, strategies and considerations relating to the purification, analytics and characterization of therapeutic antibodies and related molecules. While there are obviously other books published in and around this subject area, they seem to be either older (c.a. year 2000 publication date) or are more limited in scope. The book will include an extensive bibliography of the published literature in the respective areas covered. It is not, however, intended to be a how-to methods book. Covers the vital new area of R&D on therapeutic antibodies Written by leading scientists and researchers Up-to-date coverage and includes a detailed bibliography
A Writer's Guide to Characterization
Author: Victoria Lynn Schmidt
Publisher: Penguin
ISBN: 1599635593
Category : Language Arts & Disciplines
Languages : en
Pages : 258
Book Description
Develop compelling character arcs using the power of myth! In the best novels, characters undergo dramatic changes that keep readers turning pages. A Writer's Guide to Characterization shows you how to develop such meaningful character arcs in your own work--stories of transformation that will resonate with readers long after the story ends. In this comprehensive guide, author Victoria Lynn Schmidt examines cross-cultural archetypes to illustrate how they can make your work more powerful and compelling. Plus, you'll learn how to draw from Jungian psychology to add complexity and believability to your characters. Schmidt also provides: • 40 lessons on character development (with examples from well-known films and novels) that you can apply to your own work • Questionnaires and exercises to help you select male and female archetypes and adapt them to your story • 15 classic animal archetypes (including the coyote, snake, tiger, and butterfly) you can use to build convincing character profiles With A Writer's Guide to Characterization, you'll have the information you need to infuse the development of your characters with drama and authenticity.
Publisher: Penguin
ISBN: 1599635593
Category : Language Arts & Disciplines
Languages : en
Pages : 258
Book Description
Develop compelling character arcs using the power of myth! In the best novels, characters undergo dramatic changes that keep readers turning pages. A Writer's Guide to Characterization shows you how to develop such meaningful character arcs in your own work--stories of transformation that will resonate with readers long after the story ends. In this comprehensive guide, author Victoria Lynn Schmidt examines cross-cultural archetypes to illustrate how they can make your work more powerful and compelling. Plus, you'll learn how to draw from Jungian psychology to add complexity and believability to your characters. Schmidt also provides: • 40 lessons on character development (with examples from well-known films and novels) that you can apply to your own work • Questionnaires and exercises to help you select male and female archetypes and adapt them to your story • 15 classic animal archetypes (including the coyote, snake, tiger, and butterfly) you can use to build convincing character profiles With A Writer's Guide to Characterization, you'll have the information you need to infuse the development of your characters with drama and authenticity.
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Characters and Characterization in the Book of Kings
Author: Keith Bodner
Publisher: Bloomsbury Publishing
ISBN: 0567680916
Category : Religion
Languages : en
Pages : 321
Book Description
This book is an examination of characters in the books of Kings; showing how understanding and interpretation of key characters affects readings of the story. The volume begins with more general pieces addressing how the study of characters can shed light on the composition history of Kings and on how characters and characterization can be considered with respect to ethics, particularly with respect to the moral complexity of biblical characters. Contributors then consider key characters within the Kings narrative in depth, such as Nathan, Bathsheba, Solomon and Jezebel. The contributors use their own specific expertise to analyze these characters and more, drawing on insights from literary theory and considering such approaches as questioning our view of a particular character with based on the character within the text with whom we identify. Contributors also assess whether or not characters as portrayed in the biblical text necessarily match up to their possible counterparts in history.
Publisher: Bloomsbury Publishing
ISBN: 0567680916
Category : Religion
Languages : en
Pages : 321
Book Description
This book is an examination of characters in the books of Kings; showing how understanding and interpretation of key characters affects readings of the story. The volume begins with more general pieces addressing how the study of characters can shed light on the composition history of Kings and on how characters and characterization can be considered with respect to ethics, particularly with respect to the moral complexity of biblical characters. Contributors then consider key characters within the Kings narrative in depth, such as Nathan, Bathsheba, Solomon and Jezebel. The contributors use their own specific expertise to analyze these characters and more, drawing on insights from literary theory and considering such approaches as questioning our view of a particular character with based on the character within the text with whom we identify. Contributors also assess whether or not characters as portrayed in the biblical text necessarily match up to their possible counterparts in history.
Characterization Techniques for Perovskite Solar Cell Materials
Author: Meysam Pazoki
Publisher: Elsevier
ISBN: 0128147288
Category : Technology & Engineering
Languages : en
Pages : 278
Book Description
Characterization Techniques for Perovskite Solar Cell Materials: Characterization of Recently Emerged Perovskite Solar Cell Materials to Provide an Understanding of the Fundamental Physics on the Nano Scale and Optimize the Operation of the Device Towards Stable and Low-Cost Photovoltaic Technology explores the characterization of nanocrystals of the perovskite film, related interfaces, and the overall impacts of these properties on device efficiency. Included is a collection of both main and research techniques for perovskite solar cells. For the first time, readers will have a complete reference of different characterization techniques, all housed in a work written by highly experienced experts. - Explores various characterization techniques for perovskite solar cells and discusses both their strengths and weaknesses - Discusses material synthesis and device fabrication of perovskite solar cells - Includes a comparison throughout the work on how to distinguish one perovskite solar cell from another
Publisher: Elsevier
ISBN: 0128147288
Category : Technology & Engineering
Languages : en
Pages : 278
Book Description
Characterization Techniques for Perovskite Solar Cell Materials: Characterization of Recently Emerged Perovskite Solar Cell Materials to Provide an Understanding of the Fundamental Physics on the Nano Scale and Optimize the Operation of the Device Towards Stable and Low-Cost Photovoltaic Technology explores the characterization of nanocrystals of the perovskite film, related interfaces, and the overall impacts of these properties on device efficiency. Included is a collection of both main and research techniques for perovskite solar cells. For the first time, readers will have a complete reference of different characterization techniques, all housed in a work written by highly experienced experts. - Explores various characterization techniques for perovskite solar cells and discusses both their strengths and weaknesses - Discusses material synthesis and device fabrication of perovskite solar cells - Includes a comparison throughout the work on how to distinguish one perovskite solar cell from another
The Duchess of Malfi
Author: John Webster
Publisher: Manchester University Press
ISBN: 9780719043574
Category : Drama
Languages : en
Pages : 196
Book Description
More widely studied and more frequently performed than ever before, John Webster's The Duchess of Malfi is here presented in an accessible and thoroughly up-to-date edition. Based on the Revels Plays text, the notes have been augmented to cast further light both on Webster's amazing dialogue and on the stage action. An entirely new introduction sets the tragedy in the context of pre-Civil War England and gives a revealing view of its imagery and dramatic action. From its well-documented early performances to the two productions seen in the West End of London in the 1995-96 season, a stage history gives an account of the play in performance. Students, actors, directors and theatre-goers will all find here a reappraisal of Webster's artistry in the greatest age of English theatre, which highlights why it has lived on stage with renewed force in the last decades of the twentieth century.
Publisher: Manchester University Press
ISBN: 9780719043574
Category : Drama
Languages : en
Pages : 196
Book Description
More widely studied and more frequently performed than ever before, John Webster's The Duchess of Malfi is here presented in an accessible and thoroughly up-to-date edition. Based on the Revels Plays text, the notes have been augmented to cast further light both on Webster's amazing dialogue and on the stage action. An entirely new introduction sets the tragedy in the context of pre-Civil War England and gives a revealing view of its imagery and dramatic action. From its well-documented early performances to the two productions seen in the West End of London in the 1995-96 season, a stage history gives an account of the play in performance. Students, actors, directors and theatre-goers will all find here a reappraisal of Webster's artistry in the greatest age of English theatre, which highlights why it has lived on stage with renewed force in the last decades of the twentieth century.
X-ray Characterization of Materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Microstructural Characterization of Materials
Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.