Characterisation of Radiation Damage by Transmission Electron Microscopy PDF Download
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Author: M.L Jenkins
Publisher: CRC Press
ISBN: 1420034642
Category : Medical
Languages : en
Pages : 233
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Book Description
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Author: M.L Jenkins
Publisher: CRC Press
ISBN: 1420034642
Category : Medical
Languages : en
Pages : 233
Get Book Here
Book Description
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Author: Simonpietro Agnello
Publisher: John Wiley & Sons
ISBN: 1119697328
Category : Technology & Engineering
Languages : en
Pages : 500
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Book Description
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Author: M. Aindow
Publisher: CRC Press
ISBN: 9780750308120
Category : Science
Languages : en
Pages : 562
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Book Description
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
Author: Andrzej Marek Żak
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3111317013
Category : Technology & Engineering
Languages : en
Pages : 96
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Book Description
Transmission electron microscopy is a powerful tool for looking at small physical specimens from nanomaterials, metal alloys and other structural materials, to microorganisms, tissues and biomacromolecules. The book covers microscope design and explains how the miscoscope functions and operates. It provides the essential theoretical and practical information in a compact manner together with case studies and a summary of good operator practices.
Author: Peter. B Hirsch
Publisher: CRC Press
ISBN: 9780750305389
Category : Science
Languages : en
Pages : 240
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Book Description
Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Author: M. H. Loretto
Publisher: Springer Science & Business Media
ISBN: 9400955405
Category : Science
Languages : en
Pages : 218
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Book Description
The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.
Author:
Publisher: Elsevier
ISBN: 0323853064
Category : Science
Languages : en
Pages : 454
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Book Description
Analysis and Characterisation of Metal-Based Nanomaterials, Volume 93 in the Comprehensive Analytical Chemistry series, introduces recent developments in analytical methodologies for detection, characterization and quantification of metal-based nanomaterials and their applications to a variety of complex environmental, biological and food samples as well as different consumer products. Single-particle inductively coupled plasma mass spectrometry is highlighted as a powerful analytical tool for number-based concentration and size distribution, also from the metrological viewpoint. An emerging approach for the measurement of multi-metal nanoparticles by single-particle inductively coupled plasma time-of-flight mass spectrometry is discussed. Imaging of metal-based nanoparticles by hyphenated inductively coupled plasma-based techniques is also introduced. The potential of different liquid chromatography and field flow fractionation separation techniques hyphenated to inductively coupled plasma mass spectrometry is emphasized as a powerful tool in particular for complex matrices and small particles sizes. The use of different microscopic techniques for the characterization of metal-based nanoparticles and characterization of metal-based nanoparticles as contrast agents for magnetic resonance imaging are presented. Moreover, occurrence, behaviour and fate of inorganic nanoparticles in the environment is overviewed. Finally, the need for quality control standards and reference nano-materials is emphasized throughout. - Presents recent developments in analytical methodologies based on mass spectrometry, light scattering and microscopic techniques for detection, characterization and quantification of metal-based nanomaterials - Describes applications of the nanoparticle analysis in a variety of complex environmental, biological and food samples as well as different consumer products - Provides the metrological aspects for the analysis of metal-based nanoparticles when using emerging techniques such as single-particle inductively coupled plasma mass spectrometry
Author: The Minerals, Metals & Materials Society (TMS)
Publisher: John Wiley & Sons
ISBN: 1118356977
Category : Technology & Engineering
Languages : en
Pages : 909
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Book Description
This book contains chapters on cutting-edge developments presented at the TMS annual conference of 2012.
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 1475725191
Category : Science
Languages : en
Pages : 708
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Book Description
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Author: Nicolas Brodusch
Publisher: Springer
ISBN: 9811044333
Category : Technology & Engineering
Languages : en
Pages : 143
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Book Description
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
