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Author:
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 142
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Author:
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 142
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Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 158
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Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1122
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Author: Anatoly Belous
Publisher: Artech House
ISBN: 1630814687
Category : Technology & Engineering
Languages : en
Pages : 415
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Book Description
This authoritative first volume provides a solid understanding of modern spacecraft classification, failure, and electrical component requirements. This book focuses on the study of modern spacecraft, including their classification, packaging and protection, design versions, launch failure and accident analysis, and the main requirements of electronic components used. Readers find comprehensive coverage of the design and development of individual components as well as systems, their packaging, and how to make them last in space. This is a useful resource for military and civil applications. Specific topics include: The manufacturing of electronics for space; The main physical mechanisms of the impact of destabilizing factors of outer space, including various kinds of radiation, high-energy galactic icons, and particles of cosmic dust;The design of advanced space-grade microelectronic products such as memory microcircuits, microprocessors, interface and logic of microcircuits and power control microcircuits;Facts and features about the “space race” that have not been available until now.
Author: Dawn Bonnell
Publisher: John Wiley & Sons
ISBN: 047124824X
Category : Science
Languages : en
Pages : 520
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Book Description
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1830
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Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1272
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Author:
Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 466
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Author: U.S. National Aeronautics and Space Administration
Publisher:
ISBN:
Category :
Languages : en
Pages : 258
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1572
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