Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 720
Book Description
Proposed Canadian National Railway Company Acquisition of the Elgin, Joliet & Eastern Railway Company
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 720
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 720
Book Description
Nuclear Safety
Author:
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 1548
Book Description
Publisher:
ISBN:
Category : Nuclear engineering
Languages : en
Pages : 1548
Book Description
Catalog of Information on Water Data
Author:
Publisher:
ISBN:
Category : Water quality management
Languages : en
Pages : 180
Book Description
Publisher:
ISBN:
Category : Water quality management
Languages : en
Pages : 180
Book Description
Catalog of Information on Water Data
Author: Geological Survey (U.S.). Office of Water Data Coordination
Publisher:
ISBN:
Category : Hydrological stations
Languages : en
Pages : 180
Book Description
Publisher:
ISBN:
Category : Hydrological stations
Languages : en
Pages : 180
Book Description
Index to Catalog of Information on Water Data
Author:
Publisher:
ISBN:
Category : Water quality
Languages : en
Pages : 180
Book Description
Publisher:
ISBN:
Category : Water quality
Languages : en
Pages : 180
Book Description
Mainland China, Administrative Divisions and Their Seats, Official Standard Names Approved by the United States Board on Geographic Names
Author: United States. Office of Geography
Publisher:
ISBN:
Category : China
Languages : en
Pages : 270
Book Description
Publisher:
ISBN:
Category : China
Languages : en
Pages : 270
Book Description
Ion Exchange in Single Crystals for Integrated Optics and Optoelectronics
Author: Yu N. Korkishko
Publisher: Cambridge Int Science Publishing
ISBN: 189832641X
Category : Technology & Engineering
Languages : en
Pages : 531
Book Description
The book addresses many problems of ion exchange processes in LiNbO3, LiTaO3 and KTiOPO4 ferroelectrics and II-VI semiconductor single crystals for integrated optics applications. The authors start with the fundamentals of ion exchange processes in solids (Chapter 1). Chapter 1 can be considered also as an enlarged introduction to the book. Starting with Chapter 2, the general properties of LiNbO3 and LiTaO3 crystals, the methods used to study optical waveguides in these crystals as well as advanced preparation methods of optical waveguides are reviewed. Chapters 3, 4 and 5 are devoted to recent progress in the ion exchange processes in LiNbO3, LiTaO3 and KTiOPO4 crystals, respectively, and Chapter 6 summarizes the main applications of ion-exchanged waveguides in modern integrated optics. Finally, Chapter 7 deals with recently established ion exchange processes in II-VI semiconductors.
Publisher: Cambridge Int Science Publishing
ISBN: 189832641X
Category : Technology & Engineering
Languages : en
Pages : 531
Book Description
The book addresses many problems of ion exchange processes in LiNbO3, LiTaO3 and KTiOPO4 ferroelectrics and II-VI semiconductor single crystals for integrated optics applications. The authors start with the fundamentals of ion exchange processes in solids (Chapter 1). Chapter 1 can be considered also as an enlarged introduction to the book. Starting with Chapter 2, the general properties of LiNbO3 and LiTaO3 crystals, the methods used to study optical waveguides in these crystals as well as advanced preparation methods of optical waveguides are reviewed. Chapters 3, 4 and 5 are devoted to recent progress in the ion exchange processes in LiNbO3, LiTaO3 and KTiOPO4 crystals, respectively, and Chapter 6 summarizes the main applications of ion-exchanged waveguides in modern integrated optics. Finally, Chapter 7 deals with recently established ion exchange processes in II-VI semiconductors.
Computed Electron Micrographs And Defect Identification
Author: A.K. Head
Publisher: Elsevier
ISBN: 0444601473
Category : Computers
Languages : en
Pages : 413
Book Description
Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Publisher: Elsevier
ISBN: 0444601473
Category : Computers
Languages : en
Pages : 413
Book Description
Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Networked Systems
Author: Amr El Abbadi
Publisher: Springer
ISBN: 3319596470
Category : Computers
Languages : en
Pages : 485
Book Description
This book constitutes the thoroughly refereed conference proceedings of the 5th International Conference on Networked Systems, NETYS 2017, held in Marrakech, Morocco, in May 2017. The 28 full and 6 short papers presented together with 3 keynotes were carefully reviewed and selected from 81 submissions. They are organized around the following topics: networking; distributed algorithms; atomicity; security and privacy; software engineering; concurrency and specifications; policies; agreement and consensus; clustering based techniques; verification; communication.
Publisher: Springer
ISBN: 3319596470
Category : Computers
Languages : en
Pages : 485
Book Description
This book constitutes the thoroughly refereed conference proceedings of the 5th International Conference on Networked Systems, NETYS 2017, held in Marrakech, Morocco, in May 2017. The 28 full and 6 short papers presented together with 3 keynotes were carefully reviewed and selected from 81 submissions. They are organized around the following topics: networking; distributed algorithms; atomicity; security and privacy; software engineering; concurrency and specifications; policies; agreement and consensus; clustering based techniques; verification; communication.
Origin-destination Airline Revenue Passenger Survey
Author: Airline Finance and Accounting Conference
Publisher:
ISBN:
Category : Aeronautics, Commercial
Languages : en
Pages : 632
Book Description
Publisher:
ISBN:
Category : Aeronautics, Commercial
Languages : en
Pages : 632
Book Description