Author: David Wood
Publisher: Creation Books
ISBN:
Category : Fiction
Languages : en
Pages : 206
Book Description
Technology and the human body are becoming increasingly entwined. As we enter the new millennium, Body Probe provides a graphic, penetrative and confrontational insight into the work of leading international performance artists and designers.
Body Probe
Author: David Wood
Publisher: Creation Books
ISBN:
Category : Fiction
Languages : en
Pages : 206
Book Description
Technology and the human body are becoming increasingly entwined. As we enter the new millennium, Body Probe provides a graphic, penetrative and confrontational insight into the work of leading international performance artists and designers.
Publisher: Creation Books
ISBN:
Category : Fiction
Languages : en
Pages : 206
Book Description
Technology and the human body are becoming increasingly entwined. As we enter the new millennium, Body Probe provides a graphic, penetrative and confrontational insight into the work of leading international performance artists and designers.
X-ray Observations for Foreign Bodies and Their Localisation
Author: Harold C. Gage
Publisher:
ISBN:
Category : Diagnosis, Radioscopic
Languages : en
Pages : 104
Book Description
Publisher:
ISBN:
Category : Diagnosis, Radioscopic
Languages : en
Pages : 104
Book Description
Measurements of Mutual Interference Heating for a Probe Antenna Mounted on an Apollo Reentry Configuration
Author: Robert A. Jones
Publisher:
ISBN:
Category :
Languages : en
Pages : 86
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 86
Book Description
Night Probe!
Author: Clive Cussler
Publisher: Bantam
ISBN: 0553394924
Category : Fiction
Languages : en
Pages : 434
Book Description
In the midst of an international crisis, Heidi Milligan, a beautiful, brilliant American naval commander, accidentally discovers an obscure reference to the long-buried North American Treaty, a precedent-shattering secret pact between the United States and Great Britain. The President believes that the treaty offers the single shot at salvation for an energy-starved, economically devastated nation, but the only two copies plummeted into the watery depths of the Atlantic in twin disasters long ago. The original document must be found—and the one American who can do the job is Dirk Pitt. But in London, a daring counterplot is being orchestrated to see that the treaty is never implemented. Brian Shaw, a master spy who has often worked hand in hand with American agents, now confronts his most challenging command. Pitt’s mission: Raise the North American Treaty. Shaw’s mission: Stop Pitt. Praise for Night Probe! and the Dirk Pitt® novels “A rich tale . . . an absorbing, carefully told mystery with plenty of surprises.”—Los Angeles Times “Dirk Pitt is a combination James Bond and Jacques Cousteau.”—New York Daily News
Publisher: Bantam
ISBN: 0553394924
Category : Fiction
Languages : en
Pages : 434
Book Description
In the midst of an international crisis, Heidi Milligan, a beautiful, brilliant American naval commander, accidentally discovers an obscure reference to the long-buried North American Treaty, a precedent-shattering secret pact between the United States and Great Britain. The President believes that the treaty offers the single shot at salvation for an energy-starved, economically devastated nation, but the only two copies plummeted into the watery depths of the Atlantic in twin disasters long ago. The original document must be found—and the one American who can do the job is Dirk Pitt. But in London, a daring counterplot is being orchestrated to see that the treaty is never implemented. Brian Shaw, a master spy who has often worked hand in hand with American agents, now confronts his most challenging command. Pitt’s mission: Raise the North American Treaty. Shaw’s mission: Stop Pitt. Praise for Night Probe! and the Dirk Pitt® novels “A rich tale . . . an absorbing, carefully told mystery with plenty of surprises.”—Los Angeles Times “Dirk Pitt is a combination James Bond and Jacques Cousteau.”—New York Daily News
The Arcturus Probe
Author: Jose Arguelles
Publisher: Light Technology Publishing
ISBN: 9780929385754
Category : Body, Mind & Spirit
Languages : en
Pages : 244
Book Description
Arcturus is the name given to the star system some thirty-seven light-years from our own. It includes at least a half dozen planetary bodies and is many times larger and much older than our own star and its system. Arcturian involvement with our system began over three million years ago when a space colony—a galactic space station—was established on Velatropa 24.4, otherwise known as Mars. With its 40,000-year warm cycles, Mars provided the perfect experimental way station. If anything went wrong, at least those on the Arcturus system would not be affected—or so it was thought. Some of those in command of the Martian project had not considered carefully enough the inexorable efficacy of karma, the law of cause and effect. By the time strange events began to transpire on Mars, little did anyone on Mars or Arcturus reckon the strange consequences of forgetting about each other's mutual existence. Thus unfolds the tale of the Arcturian experimental way station, V.24.4, otherwise known as Mars.
Publisher: Light Technology Publishing
ISBN: 9780929385754
Category : Body, Mind & Spirit
Languages : en
Pages : 244
Book Description
Arcturus is the name given to the star system some thirty-seven light-years from our own. It includes at least a half dozen planetary bodies and is many times larger and much older than our own star and its system. Arcturian involvement with our system began over three million years ago when a space colony—a galactic space station—was established on Velatropa 24.4, otherwise known as Mars. With its 40,000-year warm cycles, Mars provided the perfect experimental way station. If anything went wrong, at least those on the Arcturus system would not be affected—or so it was thought. Some of those in command of the Martian project had not considered carefully enough the inexorable efficacy of karma, the law of cause and effect. By the time strange events began to transpire on Mars, little did anyone on Mars or Arcturus reckon the strange consequences of forgetting about each other's mutual existence. Thus unfolds the tale of the Arcturian experimental way station, V.24.4, otherwise known as Mars.
Quantitative Data Processing in Scanning Probe Microscopy
Author: Petr Klapetek
Publisher: William Andrew
ISBN: 1455730599
Category : Science
Languages : en
Pages : 335
Book Description
Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. - Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings - Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable - Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)
Publisher: William Andrew
ISBN: 1455730599
Category : Science
Languages : en
Pages : 335
Book Description
Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. - Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings - Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable - Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)
A Manual of Diseases of the Nose and Throat
Author: Cornelius Godfrey Coakley
Publisher:
ISBN:
Category : Nose
Languages : en
Pages : 642
Book Description
Publisher:
ISBN:
Category : Nose
Languages : en
Pages : 642
Book Description
NASA Technical Note
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 680
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 680
Book Description
Official Gazette of the United States Patent and Trademark Office
Author: United States. Patent and Trademark Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1404
Book Description
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1404
Book Description
Electrostatic-probe Measurements of Plasma Parameters for Two Reentry Flight Experiments at 25000 Feet Per Second
Author: W. Linwood Jones
Publisher:
ISBN:
Category : Electrostatics
Languages : en
Pages : 140
Book Description
Publisher:
ISBN:
Category : Electrostatics
Languages : en
Pages : 140
Book Description