Scientific Basis for Nuclear Waste Management XVI: Volume 294 PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Scientific Basis for Nuclear Waste Management XVI: Volume 294 PDF full book. Access full book title Scientific Basis for Nuclear Waste Management XVI: Volume 294 by Charles G. Interrante. Download full books in PDF and EPUB format.
Author: Charles G. Interrante
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1006
Get Book Here
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book was first published in 1993.
Author: Robert L. Opila
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 264
Get Book Here
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Joseph I. Goldstein
Publisher: Springer
ISBN: 1493966766
Category : Technology & Engineering
Languages : en
Pages : 554
Get Book Here
Book Description
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
Author: Sridhar Komarneni
Publisher:
ISBN:
Category : Composite materials
Languages : en
Pages : 490
Get Book Here
Book Description
Author: Ronald Kraft Eby
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 280
Get Book Here
Book Description
Author: Christopher Viney
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 312
Get Book Here
Book Description
Lessons from nature; Cellular synthesis; Non-cellular synthesis; Structural and mechanical properties; Applications.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 934
Get Book Here
Book Description
Author: Charles G. Interrante
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1006
Get Book Here
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book was first published in 1993.
Author: Jing Tang Xing
Publisher: Academic Press
ISBN: 0128193530
Category : Technology & Engineering
Languages : en
Pages : 682
Get Book Here
Book Description
Fluid-Solid Interaction Dynamics: Theory, Variational Principles, Numerical Methods and Applications gives a comprehensive accounting of fluid-solid interaction dynamics, including theory, numerical methods and their solutions for various FSI problems in engineering. The title provides the fundamental theories, methodologies and results developed in the application of FSI dynamics. Four numerical approaches that can be used with almost all integrated FSI systems in engineering are presented. Methods are linked with examples to illustrate results. In addition, numerical results are compared with available experiments or numerical data in order to demonstrate the accuracy of the approaches and their value to engineering applications. The title gives readers the state-of-the-art in theory, variational principles, numerical modeling and applications for fluid-solid interaction dynamics. Readers will be able to independently formulate models to solve their engineering FSI problems using information from this book. - Presents the state-of-the-art in fluid-solid interaction dynamics, providing theory, method and results - Takes an integrated approach to formulate, model and simulate FSI problems in engineering - Illustrates results with concrete examples - Gives four numerical approaches and related theories that are suitable for almost all integrated FSI systems - Provides the necessary information for bench scientists to independently formulate, model, and solve physical FSI problems in engineering
Author: M. A. Tischler
Publisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 488
Get Book Here
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: J. Wayne Rabalais
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 624
Get Book Here
Book Description
Low Energy Ion--Surface Interactions Edited by J. Wayne Rabalais, University of Houston, Texas, USA Recent advances in experimental techniques and theoretical methodologies mean that increasingly detailed and sophisticated studies of state--or energy--selected molecular ions can now be performed. Each volume in this series will be dedicated to reviewing a specific topic, emphasizing new experimental and theoretical developments in the study of ions. This volume details the current understanding of Low Energy Ion--Surface Interactions, along with some of the novel applications. Each of the ten chapters is authored by active researchers in the field who are at the forefront of research in their particular areas. This up-to-date compilation, detailing developments occurring within the last five years, will be particularly useful to researchers and teachers involved with Low Energy Ion--Surface Interactions.
