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Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469146
Category : Technology & Engineering
Languages : en
Pages : 447
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Book Description
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469146
Category : Technology & Engineering
Languages : en
Pages : 447
Get Book Here
Book Description
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
ISBN: 3642273807
Category : Science
Languages : en
Pages : 544
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Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Tom R. Thomas
Publisher: Université de Saint-Etienne
ISBN: 9782862723891
Category :
Languages : en
Pages : 498
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Book Description
Author: Stefan Dimov
Publisher: Elsevier
ISBN: 0080462553
Category : Technology & Engineering
Languages : en
Pages : 537
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Book Description
4M 2005 - First International Conference on Multi-Material Micro Manufacture
Author: Wolfgang Moritz
Publisher: Cambridge University Press
ISBN: 1108418090
Category : Technology & Engineering
Languages : en
Pages : 475
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Book Description
Discover exciting new developments and applications of LEED and X-ray diffraction, alongside detailed introductory material.
Author: Michael Kohl
Publisher: Elsevier
ISBN: 0080538630
Category : Technology & Engineering
Languages : en
Pages : 401
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Book Description
- 2 real examples demonstrate how to obtain the service life of solar collector systems - Durable, providing fundamentals that will continue to be valuable over the next 5-10 years - Lighting a pathway to the commercialisation of solar products Solar devices lose their performance over time. The rate of degradation controls the service life of these devices. The essential concepts used to assess durability and performance of two specific solar collector systems are described, enabling researchers to assess durability in other solar devices. The examples of modelling, testing and performance measurements give researchers a how-to approach to reach crucial service lifetime predictions. Achieving successful and sustainable commercialisation of solar products relies on the fulfilment of 2 further criteria and these are also discussed. The methodology of service lifetime predictions (SLP), which is explained in detail in the book, is crucially needed in other solar technologies and is generally applicable to a wide variety of materials, components and systems used in other solar, biomedical, aerospace, electronic and coatings technologies. - 2 real examples demonstrate how to obtain the service life of solar collector systems - Reassuringly durable, providing fundamentals that will continue to be valuable over the next 5-10 years - Lighting a pathway for the commercialisation of solar products
Author:
Publisher: Academic Press
ISBN: 0128174757
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Author: Ivo Utke
Publisher: Oxford University Press
ISBN: 0199920990
Category : Technology & Engineering
Languages : en
Pages : 830
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Book Description
Nanofabrication Using Focused Ion and Electron Beams presents fundamentals of the interaction of focused ion and electron beams (FIB/FEB) with surfaces, as well as numerous applications of these techniques for nanofabrication involving different materials and devices. The book begins by describing the historical evolution of FIB and FEB systems, applied first for micro- and more recently for nanofabrication and prototyping, practical solutions available in the market for different applications, and current trends in development of tools and their integration in a fast growing field of nanofabrication and nanocharacterization. Limitations of the FIB/FEB techniques, especially important when nanoscale resolution is considered, as well as possible ways to overcome the experimental difficulties in creating new nanodevices and improving resolution of processing, are outlined. Chapters include tutorials describing fundamental aspects of the interaction of beams (FIB/FEB) with surfaces, nanostructures and adsorbed molecules; electron and ion beam chemistries; basic theory, design and configuration of equipment; simulations of processes; basic solutions for nanoprototyping. Emerging technologies as processing by cluster beams are also discussed. In addition, the book considers numerous applications of these techniques (milling, etching, deposition) for nanolithography, nanofabrication and characterization, involving different nanostructured materials and devices. Its main focus is on practical details of using focused ion and electron beams with gas assistance (deposition and etching) and without gas assistance (milling/cutting) for fabrication of devices from the fields of nanoelectronics, nanophotonics, nanomagnetics, functionalized scanning probe tips, nanosensors and other types of NEMS (nanoelectromechanical systems). Special attention is given to strategies designed to overcome limitations of the techniques (e.g., due to damaging produced by energetic ions interacting with matter), particularly those involving multi-step processes and multi-layer materials. Through its thorough demonstration of fundamental concepts and its presentation of a wide range of technologies developed for specific applications, this volume is ideal for researches from many different disciplines, as well as engineers and professors in nanotechnology and nanoscience.
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 0306469138
Category : Science
Languages : en
Pages : 316
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Book Description
With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact the field, to textiles, where the impact has been marginal. With such a range of fields and applications, questions about sample selection, preparation, treatment, and handling are difficult to cover completely in one review article or one chapter. Therefore, the editors of this book have assembled a range of experts with experience in the major fields impacted by surface characterization. It is the only book which treats the subject of sample handling, preparation, and treatment for surface characterization. It is full of tricks, cautions, and handy tips to make the laboratory scientist’s life easier. With respect to organization of the book, the topics range from discussion of vacuum to discussion of biological, organic, elemental or compound samples, to samples prepared ex situ or in situ to the vacuum, to deposition ofthin films. Generic considerations of sample preparation are also given.
Author: Thomas James Whittles
Publisher: Springer
ISBN: 3319916653
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
This book examines the electronic structure of earth-abundant and environmentally friendly materials for use as absorber layers within photovoltaic cells. The corroboration between high-quality photoemission measurements and density of states calculations yields valuable insights into why these materials have demonstrated poor device efficiencies in the vast literature cited. The book shows how the materials’ underlying electronic structures affect their properties, and how the band positions make them unsuitable for use with established solar cell technologies. After explaining these poor efficiencies, the book offers alternative window layer materials to improve the use of these absorbers. The power of photoemission and interpretation of the data in terms of factors generally overlooked in the literature, such as the materials’ oxidation and phase impurity, is demonstrated. Representing a unique reference guide, the book will be of considerable interest and value to members of the photoemission community engaged in solar cell research, and to a wider materials science audience as well.
