Atomic Force Microscopy/Scanning Tunneling Microscopy

Atomic Force Microscopy/Scanning Tunneling Microscopy PDF Author: Samuel H. Cohen
Publisher: Springer Science & Business Media
ISBN: 0306448904
Category : Science
Languages : en
Pages : 468

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Book Description
Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.