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Author: Oleh Velychko
Publisher: BoD – Books on Demand
ISBN: 1803550481
Category : Technology & Engineering
Languages : en
Pages : 152
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Book Description
In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.
Author: Oleh Velychko
Publisher: BoD – Books on Demand
ISBN: 1803550481
Category : Technology & Engineering
Languages : en
Pages : 152
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Book Description
In the modern era of scientific and technological development, the role of measurements and metrology in scientific research is becoming more and more important due to the increase in the testing of various products. Moreover, requirements for the accuracy and reliability of measurement results are increasing significantly and their ranges are expanding. Improving measurement accuracy allows us to identify the shortcomings of certain technological processes and either eliminate them or reduce their influence. This leads to better-quality products and contributes to saving energy and other resources, as well as raw materials and materials. This book discusses relevant aspects of practical metrological activity to establish traceability of measurements while increasing their accuracy and reliability. It also presents procedures for the calibration and testing of measuring instruments.
Author: Ammar Grous
Publisher: John Wiley & Sons
ISBN: 1118622596
Category : Technology & Engineering
Languages : en
Pages : 570
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Book Description
Applied Metrology for Manufacturing Engineering, stands out from traditional works due to its educational aspect. Illustrated by tutorials and laboratory models, it is accessible to users of non-specialists in the fields of design and manufacturing. Chapters can be viewed independently of each other. This book focuses on technical geometric and dimensional tolerances as well as mechanical testing and quality control. It also provides references and solved examples to help professionals and teachers to adapt their models to specific cases. It reflects recent developments in ISO and GPS standards and focuses on training that goes hand in hand with the progress of practical work and workshops dealing with measurement and dimensioning.
Author: Simon H. Connell
Publisher: World Scientific
ISBN: 9810245890
Category : Science
Languages : en
Pages : 653
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Book Description
This volume is a compilation of significant papers by leading scientists exploring exciting frontiers of physics. It presents the latest results in well-defined fields as well as fields represented by the interfaces between mainstream sciences.G 't Hooft is the 1999 Nobel Laureate in Physics and A Richter is the Stern-Gerlach prize recipient of 2000.
Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 1789844622
Category : Technology & Engineering
Languages : en
Pages : 108
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Book Description
The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.
Author: Paul Seidel
Publisher: John Wiley & Sons
ISBN: 3527412093
Category : Technology & Engineering
Languages : en
Pages : 1334
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Book Description
This wide-ranging presentation of applied superconductivity, from fundamentals and materials right up to the details of many applications, is an essential reference for physicists and engineers in academic research as well as in industry. Readers looking for a comprehensive overview on basic effects related to superconductivity and superconducting materials will expand their knowledge and understanding of both low and high Tc superconductors with respect to their application. Technology, preparation and characterization are covered for bulk, single crystals, thins fi lms as well as electronic devices, wires and tapes. The main benefit of this work lies in its broad coverage of significant applications in magnets, power engineering, electronics, sensors and quantum metrology. The reader will find information on superconducting magnets for diverse applications like particle physics, fusion research, medicine, and biomagnetism as well as materials processing. SQUIDs and their usage in medicine or geophysics are thoroughly covered, as are superconducting radiation and particle detectors, aspects on superconductor digital electronics, leading readers to quantum computing and new devices.
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 204
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Book Description
Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344
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Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: French College of Metrology
Publisher: John Wiley & Sons
ISBN: 1118614941
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
Metrology is an integral part of the structure of today’s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest.
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
ISBN: 3527412654
Category : Science
Languages : en
Pages : 243
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Book Description
The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.
Author:
Publisher:
ISBN:
Category : Physical measurements
Languages : en
Pages : 186
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Book Description
