Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation PDF Download
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Author: M.E. Fitzpatrick
Publisher: CRC Press
ISBN: 0203608992
Category : Science
Languages : en
Pages : 367
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Book Description
While residual stress can be a problem in many industries and lead to early failure of component, it can also be introduced deliberately to improve lifetimes. Knowledge of the residual stress state in a component can be critical for quality control of surface engineering processes or vital to performing an accurate assessment of component life unde
Author: M.E. Fitzpatrick
Publisher: CRC Press
ISBN: 0203608992
Category : Science
Languages : en
Pages : 367
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Book Description
While residual stress can be a problem in many industries and lead to early failure of component, it can also be introduced deliberately to improve lifetimes. Knowledge of the residual stress state in a component can be critical for quality control of surface engineering processes or vital to performing an accurate assessment of component life unde
Author: Walter Reimers
Publisher: Wiley-VCH
ISBN: 9783527315338
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Structural analysis is becoming increasingly important for the design of novel, advanced engineering materials, components and assemblies. By using the neutrons and synchrotron radiation, information about the micro- and nanostructure of materials can be obtained non-destructively and with high spatial reolution, both in the near-surface region an also in the bulk of samples and components. Besides its coverage of synchrotron and neutron sources, materials and material processes, measuring techniques, and applications, this ready reference both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods an industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
Author: Walter Reimers
Publisher: John Wiley & Sons
ISBN: 3527621938
Category : Technology & Engineering
Languages : en
Pages : 462
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Book Description
Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
Author: Peter Staron
Publisher: John Wiley & Sons
ISBN: 3527684514
Category : Technology & Engineering
Languages : en
Pages : 490
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Book Description
Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.
Author: M.T. Hutchings
Publisher: CRC Press
ISBN: 1134389809
Category : Science
Languages : en
Pages : 445
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Book Description
Over the past 25 years the field of neutron diffraction for residual stress characterization has grown tremendously, and has matured from the stage of trial demonstrations to provide a practical tool with widespread applications in materials science and engineering. While the literature on the subject has grown commensurately, it has also remained
Author: Marc Seefeldt
Publisher: Materials Research Forum LLC
ISBN: 1945291893
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
The European Conference on Residual Stresses (ECRS) series is the leading European forum for scientific exchange on internal and residual stresses in materials. It addresses both academic and industrial experts and covers a broad gamut of stress-related topics from instrumentation via experimental and modelling methodology up to stress problems in specific processes such as welding or shot-peening, and their impact on materials properties. Chapters: Diffraction Methods; Mechanical Relaxation Methods; Acoustic and Electromagnetic Methods; Composites, Nano and Microstructures; Films, Coatings and Oxides; Cold Working and Machining; Heat Treatments and Phase Transformations; Welding, Fatigue and Fracture: Stresses in Additive Manufacturing.
Author: A.J. Böttger
Publisher: Trans Tech Publications Ltd
ISBN: 3035705526
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
Proceedings of the 5th European Conference on Residual Stresses, Delft-Noordwijkerhout, The Netherlands, Sept. 29-30, 1999
Author: International Atomic Energy Agency
Publisher:
ISBN:
Category : Business & Economics
Languages : en
Pages : 108
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Book Description
Stress develops during the synthesis and use of materials such as alloys and compounds. Measurement of residual stress is essential to improve the quality of synthesized materials and diagnosis of failure and/or reliability of fabricated components.
Author: Hideo Onuki
Publisher: CRC Press
ISBN: 1134464347
Category : Science
Languages : en
Pages : 601
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Book Description
A "wiggler" is an insertion device used for spatially concentrating radiation for research purposes, and an "undulator" is a multi-period wiggler. Undulator and wiggler devices are inserted in a free straight section of the storage ring of the synchrotron. This book explores the radiation produced by these insertion devices, the engineering and ass
Author: S.J.B. Kurz
Publisher: Trans Tech Publications Ltd
ISBN: 3038262307
Category : Technology & Engineering
Languages : en
Pages : 767
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Book Description
Selected, peer reviewed papers from the 9th International Conference on Residual Stresses (ICRS 9), October 7-9, 2012, Garmisch-Partenkirchen, Germany
