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Author: Rajesh Garg
Publisher: Springer Science & Business Media
ISBN: 1441909311
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Author: Rajesh Garg
Publisher: Springer Science & Business Media
ISBN: 1441909311
Category : Technology & Engineering
Languages : en
Pages : 224
Get Book Here
Book Description
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Author: Sio-Iong Ao
Publisher: World Scientific
ISBN: 9814439088
Category : Computers
Languages : en
Pages : 325
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Book Description
This volume contains revised and extended research articles written by prominent researchers. Topics covered include electrical engineering, circuits, artificial intelligence, data mining, imaging engineering, bioinformatics, internet computing, software engineering, and industrial applications. The book offers tremendous state-of-the-art advances in electrical engineering and also serves as an excellent reference work for researchers and graduate students working with/on electrical engineering.
Author: Rajesh Garg
Publisher: Springer
ISBN: 9781441909329
Category : Technology & Engineering
Languages : en
Pages : 212
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Book Description
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Author: Sio-iong Ao
Publisher: World Scientific
ISBN: 9814439096
Category : Technology & Engineering
Languages : en
Pages : 325
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Book Description
This volume contains revised and extended research articles written by prominent researchers. Topics covered include electrical engineering, circuits, artificial intelligence, data mining, imaging engineering, bioinformatics, internet computing, software engineering, and industrial applications. The book offers tremendous state-of-the-art advances in electrical engineering and also serves as an excellent reference work for researchers and graduate students working with/on electrical engineering.
Author: Mohammad Reza Mousavi
Publisher: Springer
ISBN: 3319251414
Category : Computers
Languages : en
Pages : 155
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Book Description
This book constitutes the proceedings of the 5th International Workshop on Design, Modeling, and Evaluation of Cyber Physical Systems, CyPhy 2015, held as part of ESWeek 2015, in Amsterdam, The Netherlands, in October 2015. The 10 papers presented in this volume were carefully reviewed and selected from 13 submissions. They broadly interpret, from a diverse set of disciplines, the modeling, simulation, and evaluation of cyber-physical systems.
Author: Peter Marwedel
Publisher: Springer Science & Business Media
ISBN: 9400702574
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Until the late 1980s, information processing was associated with large mainframe computers and huge tape drives. During the 1990s, this trend shifted toward information processing with personal computers, or PCs. The trend toward miniaturization continues and in the future the majority of information processing systems will be small mobile computers, many of which will be embedded into larger products and interfaced to the physical environment. Hence, these kinds of systems are called embedded systems. Embedded systems together with their physical environment are called cyber-physical systems. Examples include systems such as transportation and fabrication equipment. It is expected that the total market volume of embedded systems will be significantly larger than that of traditional information processing systems such as PCs and mainframes. Embedded systems share a number of common characteristics. For example, they must be dependable, efficient, meet real-time constraints and require customized user interfaces (instead of generic keyboard and mouse interfaces). Therefore, it makes sense to consider common principles of embedded system design. Embedded System Design starts with an introduction into the area and a survey of specification models and languages for embedded and cyber-physical systems. It provides a brief overview of hardware devices used for such systems and presents the essentials of system software for embedded systems, like real-time operating systems. The book also discusses evaluation and validation techniques for embedded systems. Furthermore, the book presents an overview of techniques for mapping applications to execution platforms. Due to the importance of resource efficiency, the book also contains a selected set of optimization techniques for embedded systems, including special compilation techniques. The book closes with a brief survey on testing. Embedded System Design can be used as a text book for courses on embedded systems and as a source which provides pointers to relevant material in the area for PhD students and teachers. It assumes a basic knowledge of information processing hardware and software. Courseware related to this book is available at http://ls12-www.cs.tu-dortmund.de/~marwedel.
Author: Tomasz Wojcicki
Publisher: CRC Press
ISBN: 1351831437
Category : Technology & Engineering
Languages : en
Pages : 490
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Book Description
Recently the world celebrated the 60th anniversary of the invention of the first transistor. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. Today, ICs are a part of nearly every aspect of our daily lives. They help us live longer and more comfortably, and do more, faster. All this is possible because of the relentless search for new materials, circuit designs, and ideas happening on a daily basis at industrial and academic institutions around the globe. Showcasing the latest advances in very-large-scale integrated (VLSI) circuits, VLSI: Circuits for Emerging Applications provides a balanced view of industrial and academic developments beyond silicon and complementary metal–oxide–semiconductor (CMOS) technology. From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system Describes a novel approach to enable physically unclonable functions (PUFs) using intrinsic features of a VLSI chip Examines the VLSI implementations of major symmetric and asymmetric key cryptographic algorithms, hash functions, and digital signatures Discusses nonvolatile memories such as resistive random-access memory (Re-RAM), magneto-resistive RAM (MRAM), and floating-body RAM (FB-RAM) Explores organic transistors, soft errors, photonics, nanoelectromechanical (NEM) relays, reversible computation, bioinformatics, asynchronous logic, and more VLSI: Circuits for Emerging Applications presents cutting-edge research, design architectures, materials, and uses for VLSI circuits, offering valuable insight into the current state of the art of micro- and nanoelectronics.
Author: Paul Leroux
Publisher: MDPI
ISBN: 3039212796
Category : Technology & Engineering
Languages : en
Pages : 210
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Book Description
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Author: Trupti Ranjan Lenka
Publisher: Springer Nature
ISBN: 9819944953
Category : Technology & Engineering
Languages : en
Pages : 519
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Book Description
This book presents select proceedings of the International Conference on Micro and Nanoelectronics Devices, Circuits and Systems (MNDCS-2023). The book includes cutting-edge research papers in the emerging fields of micro and nanoelectronics devices, circuits, and systems from experts working in these fields over the last decade. The book is a unique collection of chapters from different areas with a common theme and is immensely useful to academic researchers and practitioners in the industry who work in this field.
Author: S. Rajaram
Publisher: Springer
ISBN: 9811359504
Category : Computers
Languages : en
Pages : 728
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Book Description
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
