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Author: Ananjan Basu
Publisher: CRC Press
ISBN: 1482214369
Category : Technology & Engineering
Languages : en
Pages : 314
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Book Description
Go Beyond Basic Distributed Circuit AnalysisAn Introduction to Microwave Measurements has been written in a way that is different from many textbooks. As an instructor teaching a master's-level course on microwave measurements, the author recognized that few of today's graduate electrical engineering students are knowledgeable about microwave measu
Author: Ananjan Basu
Publisher: CRC Press
ISBN: 1482214369
Category : Technology & Engineering
Languages : en
Pages : 314
Get Book Here
Book Description
Go Beyond Basic Distributed Circuit AnalysisAn Introduction to Microwave Measurements has been written in a way that is different from many textbooks. As an instructor teaching a master's-level course on microwave measurements, the author recognized that few of today's graduate electrical engineering students are knowledgeable about microwave measu
Author: Joel P. Dunsmore
Publisher: John Wiley & Sons
ISBN: 1119477131
Category : Technology & Engineering
Languages : en
Pages : 852
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Book Description
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Author: Geoff H. Bryant
Publisher: IET
ISBN: 9780863412967
Category : Technology & Engineering
Languages : en
Pages : 434
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Book Description
Textbook covering a wide range of microwave measurements in the time and frequency domains, including reflectometry, the Smith chart, spectrum analyzers, vector and scalar analyzers, multiports, power, noise, frequency stability, time domain reflectometry, and a comprehensive account of antenna far and near field measurements. For young engineers requiring a good background in microwave measurement principles. Annotation copyrighted by Book News, Inc., Portland, OR
Author: Iain H. Woodhouse
Publisher: CRC Press
ISBN: 1351989014
Category : Technology & Engineering
Languages : en
Pages : 397
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Book Description
Introduction to Microwave Remote Sensing offers an extensive overview of this versatile and extremely precise technology for technically oriented undergraduates and graduate students. This textbook emphasizes an important shift in conceptualization and directs it toward students with prior knowledge of optical remote sensing: the author dispels any linkage between microwave and optical remote sensing. Instead, he constructs the concept of microwave remote sensing by comparing it to the process of audio perception, explaining the workings of the ear as a metaphor for microwave instrumentation. This volume takes an “application-driven” approach. Instead of describing the technology and then its uses, this textbook justifies the need for measurement then explains how microwave technology addresses this need. Following a brief summary of the field and a history of the use of microwaves, the book explores the physical properties of microwaves and the polarimetric properties of electromagnetic waves. It examines the interaction of microwaves with matter, analyzes passive atmospheric and passive surface measurements, and describes the operation of altimeters and scatterometers. The textbook concludes by explaining how high resolution images are created using radars, and how techniques of interferometry can be applied to both passive and active sensors.
Author: Thomas H. Lee
Publisher: Cambridge University Press
ISBN: 1316175774
Category : Technology & Engineering
Languages : en
Pages : 868
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Book Description
Modern wireless communications hardware is underpinned by RF and microwave design techniques. This insightful book contains a wealth of circuit layouts, design tips, and practical measurement techniques for building and testing practical gigahertz systems. The book covers everything you need to know to design, build, and test a high-frequency circuit. Microstrip components are discussed, including tricks for extracting good performance from cheap materials. Connectors and cables are also described, as are discrete passive components, antennas, low-noise amplifiers, oscillators, and frequency synthesizers. Practical measurement techniques are presented in detail, including the use of network analyzers, sampling oscilloscopes, spectrum analyzers, and noise figure meters. Throughout the focus is practical, and many worked examples and design projects are included. There is also a CD-ROM that contains a variety of design and analysis programs. The book is packed with indispensable information for students taking courses on RF or microwave circuits and for practising engineers.
Author: Valeria Teppati
Publisher: Cambridge University Press
ISBN: 1107036410
Category : Technology & Engineering
Languages : en
Pages : 475
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Book Description
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Author: Harry Albert Atwater
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 288
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Book Description
Author: Robert A. Witte
Publisher: SciTech Publishing
ISBN:
Category : Science
Languages : en
Pages : 328
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Book Description
This book covers the theory and practice of spectrum and network measurements in electronic systems. Areas covered include: decibels, Fourier analysis, FFT and swept analyzers, modulated signals, signal distortion, noise, pulsed waveforms, averaging and filtering, transmission lines and measurement connection techniques, two-port network theory, network analyzers, and instrument performance and specifications. Noble Publishing has reprinted the 1993 volume (from Prentice Hall) as a "classic" in the field. Witte works for Agilent Rechnologies. c. Book News Inc.
Author: Joseph F. White
Publisher: John Wiley & Sons
ISBN: 1119244501
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
This textbook is an introduction to microwave engineering. The scope of this book extends from topics for a first course in electrical engineering, in which impedances are analyzed using complex numbers, through the introduction of transmission lines that are analyzed using the Smith Chart, and on to graduate level subjects, such as equivalent circuits for obstacles in hollow waveguides, analyzed using Green’s Functions. This book is a virtual encyclopedia of circuit design methods. Despite the complexity, topics are presented in a conversational manner for ease of comprehension. The book is not only an excellent text at the undergraduate and graduate levels, but is as well a detailed reference for the practicing engineer. Consider how well informed an engineer will be who has become familiar with these topics as treated in High Frequency Techniques: (in order of presentation) Brief history of wireless (radio) and the Morse code U.S. Radio Frequency Allocations Introduction to vectors AC analysis and why complex numbers and impedance are used Circuit and antenna reciprocity Decibel measure Maximum power transfer Skin effect Computer simulation and optimization of networks LC matching of one impedance to another Coupled Resonators Uniform transmission lines for propagation VSWR, return Loss and mismatch error The Telegrapher Equations (derived) Phase and Group Velocities The Impedance Transformation Equation for lines (derived) Fano's and Bode's matching limits The Smith Chart (derived) Slotted Line impedance measurement Constant Q circles on the Smith Chart Approximating a transmission line with lumped L's and C's ABCD, Z, Y and Scattering matrix analysis methods for circuits Statistical Design and Yield Analysis of products Electromagnetic Fields Gauss's Law Vector Dot Product, Divergence and Curl Static Potential and Gradient Ampere's Law and Vector Curl Maxwell's Equations and their visualization The Laplacian Rectangular, cylindrical and spherical coordinates Skin Effect The Wave Equation The Helmholtz Equations Plane Propagating Waves Rayleigh Fading Circular (elliptic) Polarization Poynting's Theorem EM fields on Transmission Lines Calculating the impedance of coaxial lines Calculating and visualizing the fields in waveguides Propagation constants and waveguide modes The Taylor Series Expansion Fourier Series and Green's Functions Higher order modes and how to suppress them Vector Potential and Retarded Potentials Wire and aperture antennas Radio propagation and path loss Electromagnetic computer simulation of structures Directional couplers The Rat Race Hybrid Even and Odd Mode Analysis applied to the backward wave coupler Network analyzer impedance and transmission measurements Two-port Scattering Parameters (s matrix) The Hybrid Ring coupler The Wilkinson power divider Filter design: Butterworth, Maximally flat & Tchebyscheff responses Filter Q Diplexer, Bandpass and Elliptic filters Richard's Transformation & Kuroda’s Identities Mumford's transmission line stub filters Transistor Amplifier Design: gain, biasing, stability, and conjugate matching Noise in systems, noise figure of an amplifier cascade Amplifier non-linearity, and spurious free dynamic range Statistical Design and Yield Analysis
Author: Scott A. Wartenberg
Publisher: Artech House
ISBN: 9781580532730
Category : Technology & Engineering
Languages : en
Pages : 256
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Book Description
The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.
