Author: Richard Leach
Publisher: Myprint
ISBN: 9780750325295
Category :
Languages : en
Pages : 200
Book Description
Advances in Optical Surface Texture Metrology
Author: Richard Leach
Publisher: Myprint
ISBN: 9780750325295
Category :
Languages : en
Pages : 200
Book Description
Publisher: Myprint
ISBN: 9780750325295
Category :
Languages : en
Pages : 200
Book Description
Advances in Optical Form and Coordinate Metrology
Author: Richard Leach
Publisher:
ISBN: 9780750325240
Category : Metrology
Languages : en
Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Publisher:
ISBN: 9780750325240
Category : Metrology
Languages : en
Pages : 0
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Optical Metrology
Author: Olivério D.D. Soares
Publisher: Springer Science & Business Media
ISBN: 9400936095
Category : Science
Languages : en
Pages : 794
Book Description
Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.
Publisher: Springer Science & Business Media
ISBN: 9400936095
Category : Science
Languages : en
Pages : 794
Book Description
Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.
Optical Imaging and Metrology
Author: Wolfgang Osten
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Handbook of Optical Metrology
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Digital Optical Measurement Techniques and Applications
Author: Pramod Rastogi
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Optical Measurement of Surface Topography
Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Advances in Spectroscopic Monitoring of the Atmosphere
Author: Weidong Chen
Publisher: Elsevier
ISBN: 0128156899
Category : Science
Languages : en
Pages : 634
Book Description
Advances in Spectroscopic Monitoring of the Atmosphere provides a comprehensive overview of cutting-edge technologies and monitoring applications. Concepts are illustrated by numerous examples with information on spectroscopic techniques and applications widely distributed throughout the text. This information is important for researchers to gain an overview of recent developments in the field and make informed selections among the most suitable techniques. This volume also provides information that will allow researchers to explore implementing and developing new diagnostic tools or new approaches for trace gas and aerosol sensing themselves. Advances in Spectroscopic Monitoring of the Atmosphere covers advanced and newly emerging spectroscopic techniques for optical metrology of gases and particles in the atmosphere. This book will be a valuable reference for atmospheric scientists, including those whose focus is applying the methods to atmospheric studies, and those who develop instrumentation. It will also serve as a useful introduction to researchers entering the field and provide relevant examples to researchers and students developing and applying optical sensors for a variety of other scientific, technical, and industrial uses. - Overview of new applications including remote sensing by UAV, laser heterodyne radiometry, dual comb spectroscopy, and more - Features in-situ observations and measurements for real-world data - Includes content on leading edge optical sensors
Publisher: Elsevier
ISBN: 0128156899
Category : Science
Languages : en
Pages : 634
Book Description
Advances in Spectroscopic Monitoring of the Atmosphere provides a comprehensive overview of cutting-edge technologies and monitoring applications. Concepts are illustrated by numerous examples with information on spectroscopic techniques and applications widely distributed throughout the text. This information is important for researchers to gain an overview of recent developments in the field and make informed selections among the most suitable techniques. This volume also provides information that will allow researchers to explore implementing and developing new diagnostic tools or new approaches for trace gas and aerosol sensing themselves. Advances in Spectroscopic Monitoring of the Atmosphere covers advanced and newly emerging spectroscopic techniques for optical metrology of gases and particles in the atmosphere. This book will be a valuable reference for atmospheric scientists, including those whose focus is applying the methods to atmospheric studies, and those who develop instrumentation. It will also serve as a useful introduction to researchers entering the field and provide relevant examples to researchers and students developing and applying optical sensors for a variety of other scientific, technical, and industrial uses. - Overview of new applications including remote sensing by UAV, laser heterodyne radiometry, dual comb spectroscopy, and more - Features in-situ observations and measurements for real-world data - Includes content on leading edge optical sensors
Practical Optical Dimensional Metrology
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9781510622937
Category : Metrology
Languages : en
Pages : 0
Book Description
Provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9781510622937
Category : Metrology
Languages : en
Pages : 0
Book Description
Provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods. The book concludes with a series of manufacturing application examples.
Optical Metrology
Author: Kjell J. Gåsvik
Publisher: John Wiley & Sons
ISBN: 0470846704
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Publisher: John Wiley & Sons
ISBN: 0470846704
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.