Advances in Optical Form and Coordinate Metrology PDF Download
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Author: Richard Leach
Publisher:
ISBN: 9780750325240
Category : Metrology
Languages : en
Pages : 0
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Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach
Publisher:
ISBN: 9780750325240
Category : Metrology
Languages : en
Pages : 0
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Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard Leach
Publisher: Myprint
ISBN: 9780750325295
Category :
Languages : en
Pages : 200
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Book Description
Author: Terry J. Quinn
Publisher: IOS Press
ISBN: 9781586031671
Category : Science
Languages : en
Pages : 886
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Book Description
Over the last decade of the 20th century, many improvements took place in the field of metrology and fundamental constants. These developments and improvements are discussed in this book. The old caesium SI second definition has found a new realization with the fountain approach, replacing the classical thermal atomic beam. The use of cold atom techniques, slowed down and cooled, has opened a number of unexpected avenues for metrology and fundamental constants, one of these possibilities being the atom interferometry. Another development was the demonstration of the possiblility of performing a direct frequency division in the visible, using short femtosecond pulses. Many other developments are also discussed.
Author: Sanjay Yadav
Publisher: Springer Nature
ISBN: 9819945941
Category : Technology & Engineering
Languages : en
Pages : 225
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Book Description
This book presents the select proceedings of the 11th National Conference on Advances in Metrology (AdMet 2022). The book highlights and discusses the recent technological developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, digital transformation in metrology, among others. This book is aimed for those engaged in conformity assessment, quality system management, calibration, and testing in all sectors of industry. The book is a valuable reference for metrologists, scientists, engineers, academicians, and students from research institutes and industrial establishments to explore the future directions and research in the areas of sensors, advance materials, measurements, and quality improvement.
Author:
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 162
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Book Description
Proceedings of the annual ISA Metrology Symposium.
Author: Wolfgang Osten
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
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Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Author: Franco Pavese
Publisher: World Scientific
ISBN: 9812839526
Category : Technology & Engineering
Languages : en
Pages : 419
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Book Description
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author: Jerzy A. Sładek
Publisher: Springer
ISBN: 366248465X
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 162
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Book Description
Author: Alistair B Forbes
Publisher: World Scientific
ISBN: 981327431X
Category : Mathematics
Languages : en
Pages : 458
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Book Description
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
