Advances in Imaging and Electron Physics Including Proceedings CPO-10 PDF Download
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Author:
Publisher: Academic Press
ISBN: 0128174765
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Author:
Publisher: Academic Press
ISBN: 0128174765
Category : Technology & Engineering
Languages : en
Pages : 378
Get Book Here
Book Description
Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Author:
Publisher: Academic Press
ISBN: 0128174757
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Author: Friedrich Förster
Publisher: Springer Nature
ISBN: 3031511719
Category :
Languages : en
Pages : 391
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Book Description
Author:
Publisher: Academic Press
ISBN: 0128209984
Category : Technology & Engineering
Languages : en
Pages : 344
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Book Description
Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562
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Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665
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Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0443193258
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Author: Martin Hÿtch
Publisher: Elsevier
ISBN: 0323989071
Category : Technology & Engineering
Languages : en
Pages : 326
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Book Description
Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies, Volume 222 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series Updated release includes the latest information on the Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies
Author: P. W. Hawkes
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 268
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Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author: José L. Morán-López
Publisher: Springer Science & Business Media
ISBN: 0306465663
Category : Gardening
Languages : en
Pages : 466
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Book Description
This book contains contributions on some of the most important and current topics on the physics of low dimensional systems. The main emphasis is on the magnetic properties of surfaces, thin films, and atomic clusters. State-of-the-art techniques are discussed in detail. Techniques for the production and measurement of nanostructures are discussed, and pioneering contributions on the effect on health of these particles are presented. Important studies on semiconductor nanostructures are addressed as well as aerosol systems.
