Author: Ankdrew Parvel
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Advanced Measurement and Test IV
Author: Ankdrew Parvel
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
21st AIAA Advanced Measurement and Ground Testing Technology Conference: 00-2528 - 00-2700
Author:
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 446
Book Description
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 446
Book Description
20th AIAA Advanced Measurement and Ground Testing Technology Conference
Author:
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 594
Book Description
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 594
Book Description
19th AIAA Advanced Measurement and Ground Testing Technology Conference
Author:
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 646
Book Description
Publisher:
ISBN:
Category : Aerodynamics
Languages : en
Pages : 646
Book Description
Advanced Measurement and Test III
Author: Andy Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038260975
Category : Technology & Engineering
Languages : en
Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Publisher: Trans Tech Publications Ltd
ISBN: 3038260975
Category : Technology & Engineering
Languages : en
Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Advanced Measurement and Test
Author: Yanwen Wu
Publisher: Trans Tech Publications
ISBN: 9780878492718
Category : Electric measurements
Languages : en
Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Publisher: Trans Tech Publications
ISBN: 9780878492718
Category : Electric measurements
Languages : en
Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Advanced Measurement and Test
Author: Riza Esa
Publisher: Trans Tech Publications Ltd
ISBN: 3038136271
Category : Technology & Engineering
Languages : en
Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Publisher: Trans Tech Publications Ltd
ISBN: 3038136271
Category : Technology & Engineering
Languages : en
Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Author:
Publisher: IOS Press
ISBN:
Category :
Languages : en
Pages : 4576
Book Description
Publisher: IOS Press
ISBN:
Category :
Languages : en
Pages : 4576
Book Description
Microelectronic Test Patterns
Author: Martin G. Buehler
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Educational Assessment
Author: Robert J. Wright
Publisher: SAGE
ISBN: 1412949173
Category : Education
Languages : en
Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).
Publisher: SAGE
ISBN: 1412949173
Category : Education
Languages : en
Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).