Author: Andy Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038260975
Category : Technology & Engineering
Languages : en
Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Advanced Measurement and Test III
Author: Andy Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038260975
Category : Technology & Engineering
Languages : en
Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Publisher: Trans Tech Publications Ltd
ISBN: 3038260975
Category : Technology & Engineering
Languages : en
Pages : 2702
Book Description
The primary aim of the proceeding is the combined coverage of the electronic test of devices, boards and systemscovering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement at the advanced level. Such an approach enables the engineer to take into account the essential mechanical properties of the material itself and special features of practical implementation, including manufacturing technology, experimental results, and design characteristics.
Advanced Measurement and Test
Author: Yanwen Wu
Publisher: Trans Tech Publications
ISBN: 9780878492718
Category : Electric measurements
Languages : en
Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Publisher: Trans Tech Publications
ISBN: 9780878492718
Category : Electric measurements
Languages : en
Pages : 0
Book Description
A collection on Advanced Measurement and Test that is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement.
Advanced Measurement and Test
Author: Riza Esa
Publisher: Trans Tech Publications Ltd
ISBN: 3038136271
Category : Technology & Engineering
Languages : en
Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Publisher: Trans Tech Publications Ltd
ISBN: 3038136271
Category : Technology & Engineering
Languages : en
Pages : 2898
Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.
Advanced Measurement and Test IV
Author: Ankdrew Parvel
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Publisher: Trans Tech Publications Ltd
ISBN: 3038267597
Category : Technology & Engineering
Languages : en
Pages : 230
Book Description
Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
Educational Assessment
Author: Robert J. Wright
Publisher: SAGE
ISBN: 1412949173
Category : Education
Languages : en
Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).
Publisher: SAGE
ISBN: 1412949173
Category : Education
Languages : en
Pages : 665
Book Description
Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).
Advanced Measurement and Test X
Author: Yanwen Wu
Publisher: Trans Tech Publications Ltd
ISBN: 3038133531
Category : Technology & Engineering
Languages : en
Pages : 1730
Book Description
This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.
Publisher: Trans Tech Publications Ltd
ISBN: 3038133531
Category : Technology & Engineering
Languages : en
Pages : 1730
Book Description
This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.
Educational Measurement for Applied Researchers
Author: Margaret Wu
Publisher: Springer
ISBN: 9811033021
Category : Mathematics
Languages : en
Pages : 312
Book Description
This book is a valuable read for a diverse group of researchers and practitioners who analyze assessment data and construct test instruments. It focuses on the use of classical test theory (CTT) and item response theory (IRT), which are often required in the fields of psychology (e.g. for measuring psychological traits), health (e.g. for measuring the severity of disorders), and education (e.g. for measuring student performance), and makes these analytical tools accessible to a broader audience. Having taught assessment subjects to students from diverse backgrounds for a number of years, the three authors have a wealth of experience in presenting educational measurement topics, in-depth concepts and applications in an accessible format. As such, the book addresses the needs of readers who use CTT and IRT in their work but do not necessarily have an extensive mathematical background. The book also sheds light on common misconceptions in applying measurement models, and presents an integrated approach to different measurement methods, such as contrasting CTT with IRT and multidimensional IRT models with unidimensional IRT models. Wherever possible, comparisons between models are explicitly made. In addition, the book discusses concepts for test equating and differential item functioning, as well as Bayesian IRT models and plausible values using simple examples. This book can serve as a textbook for introductory courses on educational measurement, as supplementary reading for advanced courses, or as a valuable reference guide for researchers interested in analyzing student assessment data.
Publisher: Springer
ISBN: 9811033021
Category : Mathematics
Languages : en
Pages : 312
Book Description
This book is a valuable read for a diverse group of researchers and practitioners who analyze assessment data and construct test instruments. It focuses on the use of classical test theory (CTT) and item response theory (IRT), which are often required in the fields of psychology (e.g. for measuring psychological traits), health (e.g. for measuring the severity of disorders), and education (e.g. for measuring student performance), and makes these analytical tools accessible to a broader audience. Having taught assessment subjects to students from diverse backgrounds for a number of years, the three authors have a wealth of experience in presenting educational measurement topics, in-depth concepts and applications in an accessible format. As such, the book addresses the needs of readers who use CTT and IRT in their work but do not necessarily have an extensive mathematical background. The book also sheds light on common misconceptions in applying measurement models, and presents an integrated approach to different measurement methods, such as contrasting CTT with IRT and multidimensional IRT models with unidimensional IRT models. Wherever possible, comparisons between models are explicitly made. In addition, the book discusses concepts for test equating and differential item functioning, as well as Bayesian IRT models and plausible values using simple examples. This book can serve as a textbook for introductory courses on educational measurement, as supplementary reading for advanced courses, or as a valuable reference guide for researchers interested in analyzing student assessment data.
Advanced Measurement and Test
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 15
Book Description
This second collection on "Advanced Measurement and Test II" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics. Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device.
Publisher:
ISBN:
Category :
Languages : en
Pages : 15
Book Description
This second collection on "Advanced Measurement and Test II" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics. Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device.
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 32
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 32
Book Description
Proceedings of the Third International Conference on Trends in Computational and Cognitive Engineering
Author: M. Shamim Kaiser
Publisher: Springer Nature
ISBN: 981167597X
Category : Technology & Engineering
Languages : en
Pages : 569
Book Description
This book presents various computational and cognitive modeling approaches in the areas of health, education, finance, environment, engineering, commerce, and industry. It is a collection of selected conference papers presented at the 3rd International Conference on Trends in Cognitive Computation Engineering (TCCE 2021), hosted online by Universiti Tun Hussein Onn Malaysia (UTHM) during October 21–22, 2021. It shares cutting-edge insights and ideas from mathematicians, engineers, scientists, and researchers and discusses fresh perspectives on problem solving in a range of research areas.
Publisher: Springer Nature
ISBN: 981167597X
Category : Technology & Engineering
Languages : en
Pages : 569
Book Description
This book presents various computational and cognitive modeling approaches in the areas of health, education, finance, environment, engineering, commerce, and industry. It is a collection of selected conference papers presented at the 3rd International Conference on Trends in Cognitive Computation Engineering (TCCE 2021), hosted online by Universiti Tun Hussein Onn Malaysia (UTHM) during October 21–22, 2021. It shares cutting-edge insights and ideas from mathematicians, engineers, scientists, and researchers and discusses fresh perspectives on problem solving in a range of research areas.