RF-Frontend Design for Process-Variation-Tolerant Receivers PDF Download
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Author: Pooyan Sakian
Publisher: Springer Science & Business Media
ISBN: 1461421217
Category : Technology & Engineering
Languages : en
Pages : 181
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Book Description
This book discusses wireless receiver design challenges, given the shrinking of circuitry into ever-smaller sizes and resulting complications on manufacturability, production yield and end price of the products. Includes countermeasures for RF designers.
Author: Pooyan Sakian
Publisher: Springer Science & Business Media
ISBN: 1461421217
Category : Technology & Engineering
Languages : en
Pages : 181
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Book Description
This book discusses wireless receiver design challenges, given the shrinking of circuitry into ever-smaller sizes and resulting complications on manufacturability, production yield and end price of the products. Includes countermeasures for RF designers.
Author: Jiann-Shiun Yuan
Publisher: Springer
ISBN: 9811008841
Category : Technology & Engineering
Languages : en
Pages : 108
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Book Description
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Author: Trent McConaghy
Publisher: Springer Science & Business Media
ISBN: 146142268X
Category : Technology & Engineering
Languages : en
Pages : 198
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Book Description
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
Author: Sourabh Khandelwal
Publisher: Springer Nature
ISBN: 3030777308
Category : Technology & Engineering
Languages : en
Pages : 194
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Book Description
This book discusses in detail the Advanced SPICE Model for GaN HEMTs (ASM-HEMT), a new industry standard model for GaN-based power and RF circuit design. The author describes this new, standard model in detail, covering the different components of the ASM GaN model from fundamental derivations to the implementation in circuit simulation tools. The book also includes a detailed description of parameter extraction steps and model quality tests, which are critically important for effective use of this standard model in circuit simulation and product design. Coverage includes both radio-frequency (RF), and power electronics applications of this model. Practical issues related to measurement data and parameter extraction flow are also discussed, enabling readers easily to adopt this new model for design flow and simulation tools. Describes in detail a new industry standard for GaN-based power and RF circuit design; Includes discussion of practical problems and their solutions in GaN device modeling; Covers both radio-frequency (RF) and power electronics application of GaN technology; Describes modeling of both GaN RF and power devices.
Author: Anu Gupta
Publisher: Springer Nature
ISBN: 9819752698
Category :
Languages : en
Pages : 358
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Book Description
Author: Inder Bahl
Publisher: John Wiley & Sons
ISBN: 9780470462317
Category : Technology & Engineering
Languages : en
Pages : 696
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Book Description
A Comprehensive and Up-to-Date Treatment of RF and Microwave Transistor Amplifiers This book provides state-of-the-art coverage of RF and microwave transistor amplifiers, including low-noise, narrowband, broadband, linear, high-power, high-efficiency, and high-voltage. Topics covered include modeling, analysis, design, packaging, and thermal and fabrication considerations. Through a unique integration of theory and practice, readers will learn to solve amplifier-related design problems ranging from matching networks to biasing and stability. More than 240 problems are included to help readers test their basic amplifier and circuit design skills-and more than half of the problems feature fully worked-out solutions. With an emphasis on theory, design, and everyday applications, this book is geared toward students, teachers, scientists, and practicing engineers who are interested in broadening their knowledge of RF and microwave transistor amplifier circuit design.
Author: Fakhfakh, Mourad
Publisher: IGI Global
ISBN: 1466666285
Category : Technology & Engineering
Languages : en
Pages : 488
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Book Description
Improving the performance of existing technologies has always been a focal practice in the development of computational systems. However, as circuitry is becoming more complex, conventional techniques are becoming outdated and new research methodologies are being implemented by designers. Performance Optimization Techniques in Analog, Mix-Signal, and Radio-Frequency Circuit Design features recent advances in the engineering of integrated systems with prominence placed on methods for maximizing the functionality of these systems. This book emphasizes prospective trends in the field and is an essential reference source for researchers, practitioners, engineers, and technology designers interested in emerging research and techniques in the performance optimization of different circuit designs.
Author: Manfred Dietrich
Publisher: Springer Science & Business Media
ISBN: 1441966218
Category : Technology & Engineering
Languages : en
Pages : 261
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Book Description
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Author: P. K. Giri
Publisher: Springer Science & Business Media
ISBN: 3642342167
Category : Technology & Engineering
Languages : en
Pages : 588
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Book Description
Nanoscale science and technology have occupied centre stage globally in modern scientific research and discourses in the early twenty first century. The enabling nature of the technology makes it important in modern electronics, computing, materials, healthcare, energy and the environment. This volume contains selected articles presented (as Invited/Oral/Poster presentations) at the 2nd international conference on advanced materials and nanotechnology (ICANN-2011) held recently at the Indian Institute of Technology Guwahati, during Dec 8-10, 2011. The list of topics covered in this proceedings include: Synthesis and self assembly of nanomaterials Nanoscale characterisation Nanophotonics & Nanoelectronics Nanobiotechnology Nanocomposites F Nanomagnetism Nanomaterials for Energy Computational Nanotechnology Commercialization of Nanotechnology The conference was represented by around 400 participants from several countries including delegates invited from USA, Germany, Japan, UK, Taiwan, Italy, Singapore, India etc.
Author: José L. Ayala
Publisher: Springer
ISBN: 3642361579
Category : Computers
Languages : en
Pages : 266
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Book Description
This book constitutes the refereed proceedings of the 22nd International Conference on Integrated Circuit and System Design, PATMOS 2012, held in Newcastle, UK Spain, in September 2012. The 25 revised full papers presented were carefully reviewed and selected from numerous submissions. The paper feature emerging challenges in methodologies and tools for the design of upcoming generations of integrated circuits and systems, including reconfigurable hardware such as FPGAs. The technical program focus on timing, performance and power consumption as well as architectural aspects with particular emphasis on modeling, design, characterization, analysis and optimization.
