A Space Experiment to Measure the Atomic Oxygen Erosion of Polymers and Demonstrate a Technique to Identify Sources of Silicone Contamination PDF Download
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 20
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Author:
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Category :
Languages : en
Pages : 20
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Author:
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Category :
Languages : en
Pages : 26
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Author: J. Kleiman
Publisher: Springer Science & Business Media
ISBN: 1402025955
Category : Science
Languages : en
Pages : 553
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This publication presents the proceedings of ICPMSE-6, the sixth international conference on Protection of Materials and Structures from Space Environment, held in Toronto May 1-3, 2002. The ICPMSE series of meetings became an important part of the LEO space community since it was started in 1991. Since then, the meeting has grown steadily, attracting a large number of engineers, researchers, managers, and scientists from industrial companies, scientific institutions and government agencies in Canada, U. S. A. , Asia, and Europe, thus becoming a true international event. This year’s meeting is gaining even stronger importance with the resumption of the ISS and other space projects in LEO, GEO and Deep Space. To reflect on these activities, the topics in the program have been extended to include protection of materials in GEO and Deep Space. The combination of a broad selection of technical and scientific topics addressed by internationally known speakers with the charm of Toronto and the hospitality of the organizers brings participants back year after year. The conference was hosted and organized by Integrity Testing Laboratory Inc. (ITL), and held at the University of Toronto’s Institute for Aerospace Studies (UTIAS). The meeting was sponsored by the Materials and Manufacturing Ontario (MMO) and the CRESTech, two Ontario Centres of Excellence; Air Force Office of Scientific Research (AFOSR/NL); MD Robotics; EMS Technologies; The Integrity Testing Laboratory (ITL); and the UTIAS.
Author:
Publisher: DIANE Publishing
ISBN: 1428918248
Category :
Languages : en
Pages : 203
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ISBN:
Category : Government publications
Languages : en
Pages : 768
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Author: National Aeronautics and Space Administration
Publisher:
ISBN: 9781726160131
Category :
Languages : en
Pages : 30
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Polymers such as polyimide Kapton and Teflon FEP (fluorinated ethylene propylene) are commonly used spacecraft materials due to their desirable properties such as flexibility, low density, and in the case of FEP low solar absorptance and high thermal emittance. Polymers on the exterior of spacecraft in the low Earth orbit (LEO) environment are exposed to energetic atomic oxygen. Atomic oxygen erosion of polymers occurs in LEO and is a threat to spacecraft durability. It is therefore important to understand the atomic oxygen erosion yield (E, the volume loss per incident oxygen atom) of polymers being considered in spacecraft design. Because long-term space exposure data is rare and very costly, short-term exposures such as on the shuttle are often relied upon for atomic oxygen erosion determination. The most common technique for determining E is through mass loss measurements. For limited duration exposure experiments, such as shuttle experiments, the atomic oxygen fluence is often so small that mass loss measurements can not produce acceptable uncertainties. Therefore, a recession measurement technique has been developed using selective protection of polymer samples, combined with postflight atomic force microscopy (AFM) analysis, to obtain accurate erosion yields of polymers exposed to low atomic oxygen fluences. This paper discusses the procedures used for this recession depth technique along with relevant characterization issues. In particular, a polymer is salt-sprayed prior to flight, then the salt is washed off postflight and AFM is used to determine the erosion depth from the protected plateau. A small sample was salt-sprayed for AFM erosion depth analysis and flown as part of the Limited Duration Candidate Exposure (LDCE-4,-5) shuttle flight experiment on STS-51. This sample was used to study issues such as use of contact versus non-contact mode imaging for determining recession depth measurements. Error analyses were conducted and the percent probable erro...
Author: Society of Automotive Engineers
Publisher:
ISBN:
Category : Technical literature
Languages : en
Pages : 400
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Author:
Publisher:
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Category : Automobiles
Languages : en
Pages : 884
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 16
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 22
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