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Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 338
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Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 338
Get Book Here
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author: Colin M. Maunder
Publisher: Addison Wesley Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 216
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Book Description
Author: Intel Corporation
Publisher: Intel Corporation (CA)
ISBN:
Category : Computers
Languages : en
Pages : 352
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Book Description
Author:
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1062
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Book Description
Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780326217
Category : Technology & Engineering
Languages : en
Pages : 624
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Book Description
Author: American Telephone and Telegraph Company
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 780
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Book Description
Reduce the risk of design flaws with this step-by-step guide. Table of Contents: Design Policy, Process, and Analysis; Design Reviews; Software; Design for Test; Configuration Control; Design Release. Index. 215 illustrations.
Author: Robert Aitken
Publisher:
ISBN: 9780769522418
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author: Paul H. Bardell
Publisher: Wiley-Interscience
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
Author: Charles E. Stroud
Publisher: Springer
ISBN: 9781475776263
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
