A Designer’s Guide to Built-In Self-Test PDF Download
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Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 338
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Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 338
Get Book Here
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author: Colin M. Maunder
Publisher: Addison Wesley Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 216
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Book Description
Author: Intel Corporation
Publisher: Intel Corporation (CA)
ISBN:
Category : Computers
Languages : en
Pages : 352
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Book Description
Author:
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1062
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Book Description
Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780326217
Category : Technology & Engineering
Languages : en
Pages : 624
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Book Description
Author: American Telephone and Telegraph Company
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 780
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Book Description
Reduce the risk of design flaws with this step-by-step guide. Table of Contents: Design Policy, Process, and Analysis; Design Reviews; Software; Design for Test; Configuration Control; Design Release. Index. 215 illustrations.
Author: Robert Aitken
Publisher:
ISBN: 9780769522418
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author: Charles E. Stroud
Publisher: Springer
ISBN: 9781475776263
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author: Ralph Ford
Publisher: McGraw-Hill Science, Engineering & Mathematics
ISBN:
Category : Computers
Languages : en
Pages : 340
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Book Description
This book is written for students and teachers engaged in electrical and computer engineering (ECE) design projects, primarily in the senior year. It guides students and faculty through the steps necessary for the successful execution of design projects. The objective of the text is to provide a treatment of the design process in ECE with a sound academic basis that is integrated with practical application. It has a strong guiding vision -- that a solid understanding of the Design Process, Design Tools, and the right mix of Professional Skills are critical for project and career success. This text is unique in providing a comprehensive design treatment for ECE.
