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Author: Joseph L. Stecher
Publisher:
ISBN:
Category : Space environment
Languages : en
Pages : 518
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Book Description
The conference provided participants with a forum to acquire and exchange information on the state-of-the-art in space simulation, test technology, atomic oxygen, program/system testing, dynamics testing, contamination, and materials. The papers presented at this conference and the resulting discussions carried out the conference theme "Space mission success through testing."
Author: Joseph L. Stecher
Publisher:
ISBN:
Category : Space environment
Languages : en
Pages : 518
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Book Description
The conference provided participants with a forum to acquire and exchange information on the state-of-the-art in space simulation, test technology, atomic oxygen, program/system testing, dynamics testing, contamination, and materials. The papers presented at this conference and the resulting discussions carried out the conference theme "Space mission success through testing."
Author: Kailash C. Kapur
Publisher: John Wiley & Sons
ISBN: 1118140672
Category : Technology & Engineering
Languages : en
Pages : 528
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Book Description
An Integrated Approach to Product Development Reliability Engineering presents an integrated approach to the design, engineering, and management of reliability activities throughout the life cycle of a product, including concept, research and development, design, manufacturing, assembly, sales, and service. Containing illustrative guides that include worked problems, numerical examples, homework problems, a solutions manual, and class-tested materials, it demonstrates to product development and manufacturing professionals how to distribute key reliability practices throughout an organization. The authors explain how to integrate reliability methods and techniques in the Six Sigma process and Design for Six Sigma (DFSS). They also discuss relationships between warranty and reliability, as well as legal and liability issues. Other topics covered include: Reliability engineering in the 21st Century Probability life distributions for reliability analysis Process control and process capability Failure modes, mechanisms, and effects analysis Health monitoring and prognostics Reliability tests and reliability estimation Reliability Engineering provides a comprehensive list of references on the topics covered in each chapter. It is an invaluable resource for those interested in gaining fundamental knowledge of the practical aspects of reliability in design, manufacturing, and testing. In addition, it is useful for implementation and management of reliability programs.
Author: Ershi Qi
Publisher: Springer
ISBN: 9462391807
Category : Technology & Engineering
Languages : en
Pages : 927
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Book Description
Being the premier forum for the presentation of new advances and research results in the fields of Industrial Engineering, IEEM 2015 aims to provide a high-level international forum for experts, scholars and entrepreneurs at home and abroad to present the recent advances, new techniques and applications face and face, to promote discussion and interaction among academics, researchers and professionals to promote the developments and applications of the related theories and technologies in universities and enterprises, and to establish business or research relations to find global partners for future collaboration in the field of Industrial Engineering. All the goals of the international conference are to fulfill the mission of the series conference which is to review, exchange, summarize and promote the latest achievements in the field of industrial engineering and engineering management over the past year, and to propose prospects and vision for the further development. This volume is the first of the two proceedings volumes from this conference.
Author: Michael G. Pecht
Publisher: John Wiley & Sons
ISBN: 1119515351
Category : Technology & Engineering
Languages : en
Pages : 973
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Book Description
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
Author:
Publisher:
ISBN:
Category : Large space structures (Astronautics)
Languages : en
Pages : 368
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Book Description
Author:
Publisher:
ISBN:
Category : Space environment
Languages : en
Pages : 392
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Book Description
Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category :
Languages : en
Pages : 752
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Book Description
Author:
Publisher:
ISBN:
Category : Industrial engineering
Languages : en
Pages : 732
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Book Description
Author:
Publisher:
ISBN:
Category : Industrial engineering
Languages : en
Pages : 204
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Book Description
Author:
Publisher:
ISBN:
Category : Large space structures (Astronautics)
Languages : en
Pages : 280
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Book Description
