Author:
Publisher:
ISBN: 9781467387934
Category :
Languages : en
Pages :

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Book Description

Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages :

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Book Description
The conference covers new achievements in the design, fabrication and utilization of test structures, which are used in a variety of ways for the measurement and characterization in the field of micro nano electronics and MEMS Process and device characterization, parameter extraction, and yield enhancement are some of the typical applications discussed in the conference.

Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780352704
Category : Technology & Engineering
Languages : en
Pages : 235

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Book Description
The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 230

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Author: IEEE Staff
Publisher:
ISBN: 9781509036165
Category :
Languages : en
Pages :

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Book Description
The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions

Author:
Publisher:
ISBN: 9780780352711
Category : Electronic apparatus and appliances
Languages : en
Pages : 235

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Book Description

Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298

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Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Author:
Publisher:
ISBN: 9781479921928
Category : Microelectronics
Languages : en
Pages :

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Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780332430
Category : Technology & Engineering
Languages : en
Pages : 276

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Book Description

Author: International Conference on Microelectronic Test Structures (18, 2005, Louvain)
Publisher:
ISBN:
Category :
Languages : en
Pages : 155

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Book Description