Author:
Publisher:
ISBN: 9781424485277
Category :
Languages : en
Pages : 179
Book Description
2011 IEEE International Conference on Microelectronic Test Structures (ICMTS 2011)
Author:
Publisher:
ISBN: 9781424485277
Category :
Languages : en
Pages : 179
Book Description
Publisher:
ISBN: 9781424485277
Category :
Languages : en
Pages : 179
Book Description
2011 IEEE International Conference on Microelectronic Test Structures
Author:
Publisher:
ISBN: 9781424485284
Category : Electronic apparatus and appliances
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781424485284
Category : Electronic apparatus and appliances
Languages : en
Pages :
Book Description
2011 International Conference on Microelectronic Test Structures
Author: IEEE Electron Devices Society
Publisher:
ISBN: 9781424485260
Category :
Languages : en
Pages : 179
Book Description
Publisher:
ISBN: 9781424485260
Category :
Languages : en
Pages : 179
Book Description
Special Section on the 2011 International Conference on Microelectronic Test Structures
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 48
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 48
Book Description
2016 International Conference on Microelectronic Test Structures (ICMTS).
Author:
Publisher:
ISBN: 9781467387934
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781467387934
Category :
Languages : en
Pages :
Book Description
ICMTS '95
Author: Yoichi Tomaki
Publisher:
ISBN:
Category :
Languages : en
Pages : 34
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 34
Book Description
ICMTS 93
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298
Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780308572
Category : Integrated circuits
Languages : en
Pages : 298
Book Description
This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.
ICMTS 1999
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780352704
Category : Technology & Engineering
Languages : en
Pages : 235
Book Description
The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780352704
Category : Technology & Engineering
Languages : en
Pages : 235
Book Description
The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.
ICMTS
Author:
Publisher:
ISBN: 9781479921928
Category : Microelectronics
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781479921928
Category : Microelectronics
Languages : en
Pages :
Book Description
Formal Methods for Components and Objects
Author: Bernhard Beckert
Publisher: Springer
ISBN: 364235887X
Category : Computers
Languages : en
Pages : 363
Book Description
Formal methods have been applied successfully to the verification of medium-sized programs in protocol and hardware design for some time. However, their application to the development of large systems requires more emphasis on specification, modeling, and validation techniques supporting the concepts of reusability and modifiability, and their implementation in new extensions of existing programming languages like Java. This book contains 20 revised papers submitted after the 10th Symposium on Formal Methods for Components and Objects, FMCO 2011, which was held in Turin, Italy, in October 2011. Topics covered include autonomic service-component ensembles; trustworthy eternal systems via evolving software, data, and knowledge; parallel patterns for adaptive heterogeneous multicore systems; programming for future 3D architectures with many cores; formal verification of object oriented software; and an infrastructure for reliable computer systems.
Publisher: Springer
ISBN: 364235887X
Category : Computers
Languages : en
Pages : 363
Book Description
Formal methods have been applied successfully to the verification of medium-sized programs in protocol and hardware design for some time. However, their application to the development of large systems requires more emphasis on specification, modeling, and validation techniques supporting the concepts of reusability and modifiability, and their implementation in new extensions of existing programming languages like Java. This book contains 20 revised papers submitted after the 10th Symposium on Formal Methods for Components and Objects, FMCO 2011, which was held in Turin, Italy, in October 2011. Topics covered include autonomic service-component ensembles; trustworthy eternal systems via evolving software, data, and knowledge; parallel patterns for adaptive heterogeneous multicore systems; programming for future 3D architectures with many cores; formal verification of object oriented software; and an infrastructure for reliable computer systems.