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Author: Peter W. Epperlein
Publisher: John Wiley & Sons
ISBN: 1118481860
Category : Technology & Engineering
Languages : en
Pages : 522
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Book Description
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author: Peter W. Epperlein
Publisher: John Wiley & Sons
ISBN: 1118481860
Category : Technology & Engineering
Languages : en
Pages : 522
Get Book Here
Book Description
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author: Alex Mutig
Publisher: Springer Science & Business Media
ISBN: 3642165702
Category : Science
Languages : en
Pages : 179
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Book Description
The transmission speed of data communication systems is forecast to increase exponentially over the next decade. Development of both Si-based high-speed drivers as well as III-V-semiconductor-based high-speed vertical cavity surface emitting lasers (VCSELs) are prerequisites for future ultrahigh data-rate systems. This thesis presents: - a survey of the present state of the art of VCSELs - a systematic investigation of the various effects limiting present VCSELs - a catalogue of solutions to overcome present limits - detailed progress in modelling, fabricating and testing the currently most advanced VCSELs at the two commercially most important wavelengths.
Author: Optical Society of America
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 106
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Book Description
Author: Stephen F. Bush
Publisher: Artech House
ISBN: 1608070042
Category : Computers
Languages : en
Pages : 327
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Book Description
A highly useful resource for professionals and students alike, this cutting-edge, first-of-its-kind book provides a thorough introduction to nanoscale communication networks. Written in a clear tutorial style, this volume covers a wide range of the most important topics in the area, from molecular communication and carbon nanotube nano-networks, to nanoscale quantum networking and the future direction of nano networks. Moreover, the book features numerous exercise problems at the end of each chapter to ensure a solid understanding of the material.
Author: Klaus D. Sattler
Publisher: CRC Press
ISBN: 1420075519
Category : Science
Languages : en
Pages : 782
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Book Description
Many bottom-up and top-down techniques for nanomaterial and nanostructure generation have enabled the development of applications in nanoelectronics and nanophotonics. Handbook of Nanophysics: Nanoelectronics and Nanophotonics explores important recent applications of nanophysics in the areas of electronics and photonics. Each peer-reviewed c
Author: Thorben Kaul
Publisher: Cuvillier Verlag
ISBN: 3736963963
Category : Science
Languages : en
Pages : 136
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Book Description
This work presents progress in the root-cause analysis of power saturation mechanisms in continuous wave (CW) driven GaAs-based high-power broad area diode lasers operated at 935 nm. Target is to increase efficiency at high optical CW powers by epitaxial design. The novel extreme triple asymmetric (ETAS) design was developed and patented within this work to equip diode lasers that use an extremely thin p-waveguide with a high modal gain. An iterative variation of diode lasers employing ETAS designs was used to experimentally clarify the impact of modal gain on the temperature dependence of internal differential quantum efficiency (IDQE) and optical loss. High modal gain leads to increased free carrier absorption from the active region. However, less power saturation is observed, which must then be attributed to an improved temperature sensitivity of the IDQE. The effect of longitudinal spatial hole burning (LSHB) leads to above average non-linear carrier loss at the back facet of the device. At high CW currents the junction temperature rises. Therefore, not only the asymmetry of the carrier profile increases but also the average carrier density in order to compensate for the decreased material gain and increased threshold gain. This carrier non-pinning effect above threshold is found in this work to enhance the impact of LSHB already at low currents, leading to rapid degradation of IDQE with temperature. This finding puts LSHB into a new context for CW-driven devices as it emphasizes the importance of low carrier densities at threshold. The carrier density was effectively reduced by applying the novel ETAS design. This enabled diode lasers to be realized that show minimized degradation of IDQE with temperature and therefore improved performance in CW operation.
Author: Bishnu Pal
Publisher: BoD – Books on Demand
ISBN: 9537619826
Category : Technology & Engineering
Languages : en
Pages : 694
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Book Description
As the editor, I feel extremely happy to present to the readers such a rich collection of chapters authored/co-authored by a large number of experts from around the world covering the broad field of guided wave optics and optoelectronics. Most of the chapters are state-of-the-art on respective topics or areas that are emerging. Several authors narrated technological challenges in a lucid manner, which was possible because of individual expertise of the authors in their own subject specialties. I have no doubt that this book will be useful to graduate students, teachers, researchers, and practicing engineers and technologists and that they would love to have it on their book shelves for ready reference at any time.
Author: Hans Bjelkhagen
Publisher: CRC Press
ISBN: 1439828008
Category : Science
Languages : en
Pages : 651
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Book Description
Ultra-high resolution holograms are now finding commercial and industrial applications in such areas as holographic maps, 3D medical imaging, and consumer devices. Ultra-Realistic Imaging: Advanced Techniques in Analogue and Digital Colour Holography brings together a comprehensive discussion of key methods that enable holography to be used as a te
Author: Thomas Vallaitis
Publisher: KIT Scientific Publishing
ISBN: 3866447485
Category : Computers
Languages : en
Pages : 290
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Book Description
In this book, nonlinear silicon-organic hybrid waveguides and quantum dot semiconductor optical amplifiers are investigated. Advantageous applications are identified, and corresponding proof-of-principle experiments are performed. Highly nonlinear silicon-organic hybrid waveguides show potential for all-optical signal processing based on fourwave mixing and cross-phase modulation. Quantum dot semiconductor optical amplifiers operate as linear amplifiers with a very large dynamic range.
Author: Bekkay Hajji
Publisher: Springer
ISBN: 9811314055
Category : Technology & Engineering
Languages : en
Pages : 786
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Book Description
The proceedings present a selection of refereed papers presented at the 1st International Conference on Electronic Engineering and Renewable Energy (ICEERE 2018) held during 15-17 April 2018, Saidi, Morocco. The contributions from electrical engineers and experts highlight key issues and developments essential to the multifaceted field of electrical engineering systems and seek to address multidisciplinary challenges in Information and Communication Technologies. The book has a special focus on energy challenges for developing the Euro-Mediterranean regions through new renewable energy technologies in the agricultural and rural areas. The book is intended for academia, including graduate students, experienced researchers and industrial practitioners working in the fields of Electronic Engineering and Renewable Energy.
