Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
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Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Hafizur Rahaman
Publisher: Springer
ISBN: 3642314945
Category : Computers
Languages : en
Pages : 427
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Book Description
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Author: Zuber Patel
Publisher: Springer Nature
ISBN: 9811562296
Category : Technology & Engineering
Languages : en
Pages : 299
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Book Description
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Author: Brajesh Kumar Kaushik
Publisher: Springer
ISBN: 9811074704
Category : Computers
Languages : en
Pages : 820
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Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Author: L.-C. Tang
Publisher: IOS Press
ISBN: 1643684094
Category : Technology & Engineering
Languages : en
Pages : 880
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Book Description
The field of industrial engineering (IE) has a very wide scope, from production processes and automation to supply chain management, but the scope of IE techniques has expanded beyond the traditional domains of application, and is now relevant to areas that matter most to society at large. This book presents the proceedings of ICIEA 2023, the 10th International Conference on Industrial Engineering and Applications, held in Phuket, Thailand, from 4 to 6 April 2023. The conference was conducted in hybrid mode, with close to 100 delegates attending in person and about 50 participants attending online. A total of 272 submissions were received for the conference, of which 120 were accepted for presentation with 83 of those published here as full papers. These papers cover a wide range of topics within the scope of industrial and systems engineering, including but not limited to: supply chain and logistics; quality and reliability; advanced manufacturing; and production scheduling to ergonomics and man-machine systems interfaces. In particular, a significant number of papers are devoted to machine learning techniques and applications beyond the traditional manufacturing sector, to include healthcare, sustainability assessment, and other social issues. Offering an overview of recent research and novel applications, the book will be of interest to all those whose work involves the application of industrial engineering techniques.
Author: Anirban Sengupta
Publisher: Springer
ISBN: 9813297670
Category : Computers
Languages : en
Pages : 782
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Book Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Author: Sang-Soo Yeo
Publisher: Springer
ISBN: 3642131360
Category : Computers
Languages : en
Pages : 490
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Book Description
It is our great pleasure to present the proceedings of the symposia and workshops on parallel and distributed computing and applications associated with the ICA3PP 2010 conference. These symposia and workshops provide vibrant opportunities for researchers and industry practitioners to share their research experience, original research results and practical development experiences in the new challenging research areas of parallel and distributed computing technologies and applications. It was the first time that the ICA3PP conference series added symposia and wo- shops to its program in order to provide a wide range of topics that extend beyond the main conferences. The goal was to provide a better coverage of emerging research areas and also forums for focused and stimulating discussions. With this objective in mind, we selected three workshops to accompany the ICA3PP 2010 conference: • FPDC 2010, the 2010 International Symposium on Frontiers of Parallel and Distributed Computing • HPCTA 2010, the 2010 International Workshop on High-Performance Computing, Technologies and Applications • M2A 2010, the 2010 International Workshop on Multicore and Mul- threaded Architectures and Algorithms Each of the symposia / workshops focused on a particular theme and complemented the spectrum of the main conference. All papers published in the workshops proce- ings were selected by the Program Committee on the basis of referee reports. Each paper was reviewed by independent referees who judged the papers for originality, quality, contribution, presentation and consistency with the theme of the workshops.
Author: Robert Aitken
Publisher:
ISBN: 9780769522418
Category : Technology & Engineering
Languages : en
Pages : 524
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Book Description
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
