19th IEEE VLSI Test Symposium PDF Download
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Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
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Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
Get Book Here
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 528
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Book Description
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769506135
Category : Computers
Languages : en
Pages : 528
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Book Description
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author: Yongqing Li
Publisher: World Scientific
ISBN: 9812832238
Category : Computers
Languages : en
Pages : 288
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Book Description
The thrid and final DVD in the ED'S STORY series contains the following films: My Garden and Ask Forgiveness My Garden: When we meet someone, one of the first questions we ask is, "So, what do you do?" It's easy to become wrapped up in a career or job. But who are we outside of our work? What happens when that job is no longer there? Are we still ourselves? A pastor for many years, Ed struggled to adjust to a life without the pulpit. But he eventually discovered there is much more to who we are than what we do. Ask Forgiveness: When Ed was told his life would be over in a few short years, he found his priorities drastically rearranged. Things that used to be important became mildly relevant, while things that didn't seem to matter were now all that did. Ed realized this probably meant he could have done certain things better. As he asked those around him for forgiveness, perhaps he also helped them to see what is truly important in his life.
Author:
Publisher: World Scientific
ISBN: 9812832246
Category : Computers
Languages : en
Pages : 288
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Book Description
Over the past years, the rapid growth of the Internet and World Wide Web has provided great opportunities for online commercial activities, business transactions and government services over open computer and communication networks. However, such developments are only possible if communications can be conducted in a secure and reliable manner. The mathematical theory and practice of coding theory and cryptology underpin the provision of effective security and reliability for data communication, processing and storage. Theoretical and practical advances in these fields are therefore a key factor in facilitating the growth of data communications and data networks.The aim of the International Workshop on Coding and Cryptology 2007 was to bring together experts from coding theory, cryptology and their related areas for a fruitful exchange of ideas in order to stimulate further research and collaboration among mathematicians, computer scientists, practical cryptographers and engineers. This post-proceedings of the workshop consists of 20 selected papers on a wide range of topics in coding theory and cryptology, including theory, techniques, applications, and practical experiences. They cover significant advances in these areas and contain very useful surveys.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769501468
Category : Computers
Languages : en
Pages : 534
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Book Description
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Author: Angela Krstic
Publisher: Springer Science & Business Media
ISBN: 1461555973
Category : Technology & Engineering
Languages : en
Pages : 201
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Book Description
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 526
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Book Description
Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183
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Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
