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Author: J. G. Brown
Publisher: Springer Science & Business Media
ISBN: 1461343984
Category : Science
Languages : en
Pages : 260
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Book Description
This book is intended to provide a treatment of the production, properties and applications of X-rays suitable for undergraduate courses in physics. It is hoped that parts of it, at least, will be useful to students on other courses in physics, materials science, metallurgy, chemistry, engineering, etc. at various levels. It is also hoped that parts of it will serve as an introduction to the subject of X-ray crystallography, and to this end the treatment of X-ray diffraction has been designed to show the relation between the simple approach and the more sophisticated treatments. During many years of teaching this subject to Degree, Diploma in Technology and Higher National Certificate students, I have been unable to find a single book which attempts to cover the whole of this field. This lack of a treatment of X-rays and their applications in one volume has prompted me to attempt to fill the gap and this present volume is the result. Obviously in writing such a book I have referred to many existing books and I acknowledge my indebtedness to the authors of all the books which I have used. I believe that all these books are included in the re ferences at the ends of the chapters but if I have omitted any, then my apologies are offered to the authors concerned.
Author: J. G. Brown
Publisher: Springer Science & Business Media
ISBN: 1461343984
Category : Science
Languages : en
Pages : 260
Get Book Here
Book Description
This book is intended to provide a treatment of the production, properties and applications of X-rays suitable for undergraduate courses in physics. It is hoped that parts of it, at least, will be useful to students on other courses in physics, materials science, metallurgy, chemistry, engineering, etc. at various levels. It is also hoped that parts of it will serve as an introduction to the subject of X-ray crystallography, and to this end the treatment of X-ray diffraction has been designed to show the relation between the simple approach and the more sophisticated treatments. During many years of teaching this subject to Degree, Diploma in Technology and Higher National Certificate students, I have been unable to find a single book which attempts to cover the whole of this field. This lack of a treatment of X-rays and their applications in one volume has prompted me to attempt to fill the gap and this present volume is the result. Obviously in writing such a book I have referred to many existing books and I acknowledge my indebtedness to the authors of all the books which I have used. I believe that all these books are included in the re ferences at the ends of the chapters but if I have omitted any, then my apologies are offered to the authors concerned.
Author: G. W. C. Kaye
Publisher: Palala Press
ISBN: 9781378663592
Category : History
Languages : en
Pages : 186
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Book Description
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Author: David Attwood
Publisher: Cambridge University Press
ISBN: 1107062896
Category : Science
Languages : en
Pages : 655
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Book Description
Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.
Author: Carolyn A. MacDonald
Publisher: Princeton University Press
ISBN: 0691139652
Category : Science
Languages : en
Pages : 366
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Book Description
In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser sources. The third section details the main forms of interaction, including the physics of photoelectric absorption, coherent and Compton scattering, diffraction, and refractive, reflective, and diffractive optics. Applications in this section include x-ray spectroscopy, crystallography, and dose and contrast in radiography. A bibliography is included at the end of every chapter, and solutions to chapter problems are provided in the appendix. Based on a course for advanced undergraduates and graduate students in physics and related sciences and also intended for researchers, An Introduction to X-Ray Physics, Optics, and Applications offers a thorough survey of the physics of x-ray generation and of interaction with materials. Common aspects of diverse phenomena emphasized Theoretical development tied to practical applications Suitable for advanced undergraduate and graduate students in physics or related sciences, as well as researchers Examples and problems include applications drawn from medicine, astronomy, and materials analysis Detailed solutions are provided for all examples and problems
Author: Harry E. Martz
Publisher: CRC Press
ISBN: 1420009761
Category : Technology & Engineering
Languages : en
Pages : 590
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Book Description
While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.
Author: I. C. E. Turcu
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 348
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Book Description
Soft X-rays have great potential for use in a wide variety of applications, including the semiconductor industry and the life sciences. X-Rays from Laser Plasmas: Generation and Applications focuses exclusively and in detail on the science and technology of soft X-rays produced with non-synchrotron sources. Using a minimum of mathematical formulae, it discusses how such X-rays can be efficiently and economically generated from plasmas produced by lasers, and how they interact with matter. Authored by Dr Edmond Turcu, one of the pioneers in this field, X-Rays from Laser Plasmas: Generation and Applications will be of great interest to a wide variety of readers, including all those working in X-ray lithography, microscopy, and radiobiology.
Author: David Attwood
Publisher: Cambridge University Press
ISBN: 1139643428
Category : Technology & Engineering
Languages : en
Pages : 611
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Book Description
This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.
Author: Jean Daillant
Publisher: Springer Science & Business Media
ISBN: 3540486968
Category : Science
Languages : en
Pages : 347
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Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Christopher Clarke
Publisher:
ISBN: 9781999988524
Category :
Languages : en
Pages : 320
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Book Description
Comprehensive medical imaging physics notes aimed at those sitting the first FRCR physics exam in the UK and covering the scope of the Royal College of Radiologists syllabus. Written by Radiologists, the notes are concise and clearly organised with 100's of beautiful diagrams to aid understanding. The notes cover all of radiology physics, including basic science, x-ray imaging, CT, ultrasound, MRI, molecular imaging, and radiation dosimetry, protection and legislation. Although aimed at UK radiology trainees, it is also suitable for international residents taking similar examinations, postgraduate medical physics students and radiographers. The notes provide an excellent overview for anyone interested in the physics of radiology or just refreshing their knowledge. This third edition includes updates to reflect new legislation and many new illustrations, added sections, and removal of content no longer relevent to the FRCR physics exam. This edition has gone through strict critique and evaluation by physicists and other specialists to provide an accurate, understandable and up-to-date resource. The book summarises and pulls together content from the FRCR Physics Notes at Radiology Cafe and delivers it as a paperback or eBook for you to keep and read anytime. There are 7 main chapters, which are further subdivided into 60 sub-chapters so topics are easy to find. There is a comprehensive appendix and index at the back of the book.
