X-ray Optics for BES Light Source Facilities

X-ray Optics for BES Light Source Facilities PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 150

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Book Description
Each new generation of synchrotron radiation sources has delivered an increase in average brightness 2 to 3 orders of magnitude over the previous generation. The next evolution toward diffraction-limited storage rings will deliver another 3 orders of magnitude increase. For ultrafast experiments, free electron lasers (FELs) deliver 10 orders of magnitude higher peak brightness than storage rings. Our ability to utilize these ultrabright sources, however, is limited by our ability to focus, monochromate, and manipulate these beams with X-ray optics. X-ray optics technology unfortunately lags behind source technology and limits our ability to maximally utilize even today's X-ray sources. With ever more powerful X-ray sources on the horizon, a new generation of X-ray optics must be developed that will allow us to fully utilize these beams of unprecedented brightness. The increasing brightness of X-ray sources will enable a new generation of measurements that could have revolutionary impact across a broad area of science, if optical systems necessary for transporting and analyzing X-rays can be perfected. The high coherent flux will facilitate new science utilizing techniques in imaging, dynamics, and ultrahigh-resolution spectroscopy. For example, zone-plate-based hard X-ray microscopes are presently used to look deeply into materials, but today's resolution and contrast are restricted by limitations of the current lithography used to manufacture nanodiffractive optics. The large penetration length, combined in principle with very high spatial resolution, is an ideal probe of hierarchically ordered mesoscale materials, if zone-plate focusing systems can be improved. Resonant inelastic X-ray scattering (RIXS) probes a wide range of excitations in materials, from charge-transfer processes to the very soft excitations that cause the collective phenomena in correlated electronic systems. However, although RIXS can probe high-energy excitations, the most exciting and potentially revolutionary science involves soft excitations such as magnons and phonons; in general, these are well below the resolution that can be probed by today's optical systems. The study of these low-energy excitations will only move forward if advances are made in high-resolution gratings for the soft X-ray energy region, and higher-resolution crystal analyzers for the hard X-ray region. In almost all the forefront areas of X-ray science today, the main limitation is our ability to focus, monochromate, and manipulate X-rays at the level required for these advanced measurements. To address these issues, the U.S. Department of Energy (DOE) Office of Basic Energy Sciences (BES) sponsored a workshop, X-ray Optics for BES Light Source Facilities, which was held March 27-29, 2013, near Washington, D.C. The workshop addressed a wide range of technical and organizational issues. Eleven working groups were formed in advance of the meeting and sought over several months to define the most pressing problems and emerging opportunities and to propose the best routes forward for a focused R & D program to solve these problems. The workshop participants identified eight principal research directions (PRDs), as follows: Development of advanced grating lithography and manufacturing for high-energy resolution techniques such as soft X-ray inelastic scattering. Development of higher-precision mirrors for brightness preservation through the use of advanced metrology in manufacturing, improvements in manufacturing techniques, and in mechanical mounting and cooling. Development of higher-accuracy optical metrology that can be used in manufacturing, verification, and testing of optomechanical systems, as well as at wavelength metrology that can be used for quantification of individual optics and alignment and testing of beamlines. Development of an integrated optical modeling and design framework that is designed and maintained specifically for X-ray optics. Development of nanolithogra ...

X-ray Optics for BES Light Source Facilities

X-ray Optics for BES Light Source Facilities PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 150

Get Book Here

Book Description
Each new generation of synchrotron radiation sources has delivered an increase in average brightness 2 to 3 orders of magnitude over the previous generation. The next evolution toward diffraction-limited storage rings will deliver another 3 orders of magnitude increase. For ultrafast experiments, free electron lasers (FELs) deliver 10 orders of magnitude higher peak brightness than storage rings. Our ability to utilize these ultrabright sources, however, is limited by our ability to focus, monochromate, and manipulate these beams with X-ray optics. X-ray optics technology unfortunately lags behind source technology and limits our ability to maximally utilize even today's X-ray sources. With ever more powerful X-ray sources on the horizon, a new generation of X-ray optics must be developed that will allow us to fully utilize these beams of unprecedented brightness. The increasing brightness of X-ray sources will enable a new generation of measurements that could have revolutionary impact across a broad area of science, if optical systems necessary for transporting and analyzing X-rays can be perfected. The high coherent flux will facilitate new science utilizing techniques in imaging, dynamics, and ultrahigh-resolution spectroscopy. For example, zone-plate-based hard X-ray microscopes are presently used to look deeply into materials, but today's resolution and contrast are restricted by limitations of the current lithography used to manufacture nanodiffractive optics. The large penetration length, combined in principle with very high spatial resolution, is an ideal probe of hierarchically ordered mesoscale materials, if zone-plate focusing systems can be improved. Resonant inelastic X-ray scattering (RIXS) probes a wide range of excitations in materials, from charge-transfer processes to the very soft excitations that cause the collective phenomena in correlated electronic systems. However, although RIXS can probe high-energy excitations, the most exciting and potentially revolutionary science involves soft excitations such as magnons and phonons; in general, these are well below the resolution that can be probed by today's optical systems. The study of these low-energy excitations will only move forward if advances are made in high-resolution gratings for the soft X-ray energy region, and higher-resolution crystal analyzers for the hard X-ray region. In almost all the forefront areas of X-ray science today, the main limitation is our ability to focus, monochromate, and manipulate X-rays at the level required for these advanced measurements. To address these issues, the U.S. Department of Energy (DOE) Office of Basic Energy Sciences (BES) sponsored a workshop, X-ray Optics for BES Light Source Facilities, which was held March 27-29, 2013, near Washington, D.C. The workshop addressed a wide range of technical and organizational issues. Eleven working groups were formed in advance of the meeting and sought over several months to define the most pressing problems and emerging opportunities and to propose the best routes forward for a focused R & D program to solve these problems. The workshop participants identified eight principal research directions (PRDs), as follows: Development of advanced grating lithography and manufacturing for high-energy resolution techniques such as soft X-ray inelastic scattering. Development of higher-precision mirrors for brightness preservation through the use of advanced metrology in manufacturing, improvements in manufacturing techniques, and in mechanical mounting and cooling. Development of higher-accuracy optical metrology that can be used in manufacturing, verification, and testing of optomechanical systems, as well as at wavelength metrology that can be used for quantification of individual optics and alignment and testing of beamlines. Development of an integrated optical modeling and design framework that is designed and maintained specifically for X-ray optics. Development of nanolithogra ...

High-precision EUV and X-ray Optics for Advanced Photon Source Facilities

High-precision EUV and X-ray Optics for Advanced Photon Source Facilities PDF Author: Qiushi Huang
Publisher: Frontiers Media SA
ISBN: 2832513182
Category : Science
Languages : en
Pages : 95

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Book Description


Fourth-generation X-ray Sources and Optics II

Fourth-generation X-ray Sources and Optics II PDF Author: Sandra G. Biedron
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 180

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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

X-ray Optics Developments at the APS for Third-generation Synchrotron Radiation Sources

X-ray Optics Developments at the APS for Third-generation Synchrotron Radiation Sources PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 29

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Book Description
High brilliance third-generation synchrotron radiation sources simultaneously provide both a need and an opportunity for the development of new x-ray optical components. The high power and power densities of the x-ray beams produced by insertion devices have forced researchers to consider novel, and what may seem like exotic, approaches to the mitigation of thermal distortions that can dilute the beam brilliance delivered to the experiment or next optical component. Once the power has been filtered by such high heat load optical elements, specialized components can be employed that take advantage of the high degree of brilliance. This presentation reviews the performance of optical components that have been designed, fabricated, and tested at the Advanced Photon Source, starting with high heat load components and followed by examples of several specialized devices such as a milli-eV resolution (in-line) monochromator, a high energy x-ray phase retarder, and a phase zone plate with submicron focusing capability.

Optics for Fourth-generation X-ray Sources

Optics for Fourth-generation X-ray Sources PDF Author:
Publisher:
ISBN:
Category : Free electron lasers
Languages : en
Pages : 214

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Book Description


X-Ray Spectroscopy with Synchrotron Radiation

X-Ray Spectroscopy with Synchrotron Radiation PDF Author: Stephen P. Cramer
Publisher: Springer Nature
ISBN: 3030285510
Category : Science
Languages : en
Pages : 396

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Book Description
Synchrotron radiation has been a revolutionary and invaluable research tool for a wide range of scientists, including chemists, biologists, physicists, materials scientists, geophysicists. It has also found multidisciplinary applications with problems ranging from archeology through cultural heritage to paleontology. The subject of this book is x-ray spectroscopy using synchrotron radiation, and the target audience is both current and potential users of synchrotron facilities. The first half of the book introduces readers to the fundamentals of storage ring operations, the qualities of the synchrotron radiation produced, the x-ray optics required to transport this radiation, and the detectors used for measurements. The second half of the book describes the important spectroscopic techniques that use synchrotron x-rays, including chapters on x-ray absorption, x-ray fluorescence, resonant and non-resonant inelastic x-ray scattering, nuclear spectroscopies, and x-ray photoemission. A final chapter surveys the exciting developments of free electron laser sources, which promise a second revolution in x-ray science. Thanks to the detailed descriptions in the book, prospective users will be able to quickly begin working with these techniques. Experienced users will find useful summaries, key equations, and exhaustive references to key papers in the field, as well as outlines of the historical developments in the field. Along with plentiful illustrations, this work includes access to supplemental Mathematica notebooks, which can be used for some of the more complex calculations and as a teaching aid. This book should appeal to graduate students, postdoctoral researchers, and senior scientists alike.

X-Ray Optics

X-Ray Optics PDF Author: Yuri Shvyd'ko
Publisher: Springer
ISBN: 3540408908
Category : Science
Languages : en
Pages : 416

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Book Description
The use of x rays has moved in the forefront of science and technology in the second half of the 20th century. This progress has been greatly stimulated by the advent of synchrotron x-ray sources in the 1960s. The undulator-based synchrotron radiation sources which have appeared in the last decade of the 20th century gave a new impetus to such development. The brilliance of the x-ray sources has increased by 12 orders of magnitude in 40 years and this trend does not show any signs of stagnation. The future x-ray sources of the 21th century based on free-electron lasers driven by linear accelerators will provide sub-picosecond radiation pulses with by many orders of magnitude higher brilliance and full transverse coherence. The x-ray sources of the newest generation offer a possibility to realize more than ever before the great potential of x-ray optics and, as a consequence, to elaborate new sophisticated instrumentation with unprecedented resolution and eventually to move in new directions of research in x-ray technology, materials science, fundamental physics, life sciences, etc.

Focusing Hard X-rays at Current and Future Light Sources for Microscopy and High-Power Applications

Focusing Hard X-rays at Current and Future Light Sources for Microscopy and High-Power Applications PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Book Description
The field of x-ray optics struggles to develop optical systems with the versatility and sophistication of their visible light counterparts. The advent of fourth-generation light sources will make the struggle even more difficult. Fourth-generation light sources include laser/plasma sources, x-ray Free Electron Lasers (FEL), inverse Compton scattering sources, and the National Ignition Facility. LCLS, (Linac Coherent Light Source), and its European cousin, will be the first of the x-ray FELs. The LCLS, to be built at the Stanford Linear Accelerator Center (SLAC), takes advantage of the existing SLAC linear accelerator to send intense, low emittance electron bunches through a 100 m long undulator structure. Through a process called SASE (Self Amplification of Spontaneous Emission) the electrons interact with the radiation fields they produce while in the undulator causing them to collect into micro bunches that emit coherent light. In the case of the LCLS the coherent radiation will have a wavelength in the x-ray regime, and will be tunable from 1.5 to 15 Å. The LCLS will deliver x-rays in individual coherent packages lasting

Modern Developments in X-Ray and Neutron Optics

Modern Developments in X-Ray and Neutron Optics PDF Author: Alexei Erko
Publisher: Springer
ISBN: 3540745610
Category : Science
Languages : en
Pages : 541

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Book Description
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.

Soft X-ray Optics

Soft X-ray Optics PDF Author: Eberhard Spiller
Publisher: SPIE Press
ISBN: 9780819416544
Category : Medical
Languages : en
Pages : 296

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Book Description
This text describes optics mainly in the 10 to 500 angstrom wavelength region. These wavelengths are 50 to 100 times shorter than those for visible light and 50 to 100 times longer than the wavelengths of medical x rays or x-ray diffraction from natural crystals. There have been substantial advances during the last 20 years, which one can see as an extension of optical technology to shorter wavelengths or as an extension of x-ray diffraction to longer wavelengths. Artificial diffracting structures like zone plates and multilayer mirrors are replacing the natural crystals of x-ray diffraction. Some of these structures can now be fabricated to have diffraction-limited resolution. The new possibilities are described in a simple, tutorial way.