Author:
Publisher: World Scientific
ISBN: 981464434X
Category : Science
Languages : en
Pages : 1556
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Book Description
Review of Volume 4:'The Handbook can be a good reference for a higher-degree science student approaching the subject or for an expert in a similar field in astronomical instrumentation. The reader requiring an in-depth presentation of a specific topic will be guided by the rich reference lists included at the end of each chapter.'The ObservatoryOur goal is to produce a comprehensive handbook of the current state of the art of astronomical instrumentation with a forward view encompassing the next decade. The target audience is graduate students with an interest in astronomical instrumentation, as well as practitioners interested in learning about the state of the art in another wavelength band or field closely related to the one in which they currently work. We assume a working knowledge of the fundamental theory: optics, semiconductor physics, etc. The purpose of this handbook is to bring together some of the leading experts in the world to discuss the frontier of astronomical instrumentation across the electromagnetic spectrum and extending into multimessenger astronomy.
Author: Carolyn A. MacDonald
Publisher: Princeton University Press
ISBN: 0691139652
Category : Science
Languages : en
Pages : 366
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Book Description
In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser sources. The third section details the main forms of interaction, including the physics of photoelectric absorption, coherent and Compton scattering, diffraction, and refractive, reflective, and diffractive optics. Applications in this section include x-ray spectroscopy, crystallography, and dose and contrast in radiography. A bibliography is included at the end of every chapter, and solutions to chapter problems are provided in the appendix. Based on a course for advanced undergraduates and graduate students in physics and related sciences and also intended for researchers, An Introduction to X-Ray Physics, Optics, and Applications offers a thorough survey of the physics of x-ray generation and of interaction with materials. Common aspects of diverse phenomena emphasized Theoretical development tied to practical applications Suitable for advanced undergraduate and graduate students in physics or related sciences, as well as researchers Examples and problems include applications drawn from medicine, astronomy, and materials analysis Detailed solutions are provided for all examples and problems
Author: Paul Gorenstein
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Nature
Languages : en
Pages : 182
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Book Description
Author: Keith Arnaud
Publisher: Cambridge University Press
ISBN: 1139502565
Category : Science
Languages : en
Pages : 207
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Book Description
Modern x-ray data, available through online archives, are important for many astronomical topics. However, using these data requires specialized techniques and software. Written for graduate students, professional astronomers and researchers who want to start working in this field, this book is a practical guide to x-ray astronomy. The handbook begins with x-ray optics, basic detector physics and CCDs, before focussing on data analysis. It introduces the reduction and calibration of x-ray data, scientific analysis, archives, statistical issues and the particular problems of highly extended sources. The book describes the main hardware used in x-ray astronomy, emphasizing the implications for data analysis. The concepts behind common x-ray astronomy data analysis software are explained. The appendices present reference material often required during data analysis.
Author:
Publisher:
ISBN:
Category : Scientific satellites
Languages : en
Pages : 774
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Book Description
Author: Oberto Citterio
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819450418
Category : Science
Languages : en
Pages : 554
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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author: J. Leonard Culhane
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 430
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Book Description
Author: Richard B. Hoover
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Nature
Languages : en
Pages : 562
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Book Description
Author: Carolyn A. MacDonald
Publisher: Princeton University Press
ISBN: 1400887739
Category : Science
Languages : en
Pages : 368
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Book Description
In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser sources. The third section details the main forms of interaction, including the physics of photoelectric absorption, coherent and Compton scattering, diffraction, and refractive, reflective, and diffractive optics. Applications in this section include x-ray spectroscopy, crystallography, and dose and contrast in radiography. A bibliography is included at the end of every chapter, and solutions to chapter problems are provided in the appendix. Based on a course for advanced undergraduates and graduate students in physics and related sciences and also intended for researchers, An Introduction to X-Ray Physics, Optics, and Applications offers a thorough survey of the physics of x-ray generation and of interaction with materials. Common aspects of diverse phenomena emphasized Theoretical development tied to practical applications Suitable for advanced undergraduate and graduate students in physics or related sciences, as well as researchers Examples and problems include applications drawn from medicine, astronomy, and materials analysis Detailed solutions are provided for all examples and problems
Author: Gottfried Möllenstedt
Publisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : de
Pages : 624
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Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
