Advanced X-ray Techniques in Research and Industry PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Advanced X-ray Techniques in Research and Industry PDF full book. Access full book title Advanced X-ray Techniques in Research and Industry by Ashok Kumar Singh. Download full books in PDF and EPUB format.
Author: Ashok Kumar Singh
Publisher: IOS Press
ISBN: 9781586035372
Category : Medical
Languages : en
Pages : 604
Get Book Here
Book Description
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
Author: Ashok Kumar Singh
Publisher: IOS Press
ISBN: 9781586035372
Category : Medical
Languages : en
Pages : 604
Get Book Here
Book Description
Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.
Author: Harry E. Martz
Publisher: CRC Press
ISBN: 1420009761
Category : Technology & Engineering
Languages : en
Pages : 590
Get Book Here
Book Description
While books on the medical applications of x-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-Ray Imaging fills the need for a comprehensive work on modern industrial x-ray imaging. It reviews the fundamental science of x-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital x-ray imaging system.
Author: Andrei Benediktovich
Publisher: Springer Science & Business Media
ISBN: 3642381774
Category : Technology & Engineering
Languages : en
Pages : 325
Get Book Here
Book Description
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Author: Andreas Maier
Publisher: Springer
ISBN: 3319965204
Category : Computers
Languages : en
Pages : 263
Get Book Here
Book Description
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Author: Paolo Russo
Publisher: CRC Press
ISBN: 1498741541
Category : Medical
Languages : en
Pages : 1477
Get Book Here
Book Description
Containing chapter contributions from over 130 experts, this unique publication is the first handbook dedicated to the physics and technology of X-ray imaging, offering extensive coverage of the field. This highly comprehensive work is edited by one of the world’s leading experts in X-ray imaging physics and technology and has been created with guidance from a Scientific Board containing respected and renowned scientists from around the world. The book's scope includes 2D and 3D X-ray imaging techniques from soft-X-ray to megavoltage energies, including computed tomography, fluoroscopy, dental imaging and small animal imaging, with several chapters dedicated to breast imaging techniques. 2D and 3D industrial imaging is incorporated, including imaging of artworks. Specific attention is dedicated to techniques of phase contrast X-ray imaging. The approach undertaken is one that illustrates the theory as well as the techniques and the devices routinely used in the various fields. Computational aspects are fully covered, including 3D reconstruction algorithms, hard/software phantoms, and computer-aided diagnosis. Theories of image quality are fully illustrated. Historical, radioprotection, radiation dosimetry, quality assurance and educational aspects are also covered. This handbook will be suitable for a very broad audience, including graduate students in medical physics and biomedical engineering; medical physics residents; radiographers; physicists and engineers in the field of imaging and non-destructive industrial testing using X-rays; and scientists interested in understanding and using X-ray imaging techniques. The handbook's editor, Dr. Paolo Russo, has over 30 years’ experience in the academic teaching of medical physics and X-ray imaging research. He has authored several book chapters in the field of X-ray imaging, is Editor-in-Chief of an international scientific journal in medical physics, and has responsibilities in the publication committees of international scientific organizations in medical physics. Features: Comprehensive coverage of the use of X-rays both in medical radiology and industrial testing The first handbook published to be dedicated to the physics and technology of X-rays Handbook edited by world authority, with contributions from experts in each field
Author: Hiroyuki Toda
Publisher: Springer Nature
ISBN: 9811605904
Category : Technology & Engineering
Languages : en
Pages : 549
Get Book Here
Book Description
This book provides easy-to-understand explanations to systematically and comprehensively describe the X-ray CT technologies, techniques, and skills used for industrial and scientific purposes. Included are many references along with photographs, figures, and equations prepared by the author. These features all facilitate the reader's gaining a deeper understanding of the topics being discussed. The book presents expertise not only on fundamentals but also about hardware, software, and analytical methods for the benefit of technical users. The book targets engineers, researchers, and students who are involved in research, development, design, and quality assurance in industry and academia.
Author: Oliver H. Seeck
Publisher: CRC Press
ISBN: 9814303607
Category : Science
Languages : en
Pages : 438
Get Book Here
Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
Get Book Here
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: B.K. Tanner
Publisher: Springer Science & Business Media
ISBN: 1475711263
Category : Science
Languages : en
Pages : 615
Get Book Here
Book Description
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
Author: Leroy Elbert Alexander
Publisher: Krieger Publishing Company
ISBN:
Category : Science
Languages : en
Pages : 614
Get Book Here
Book Description
