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Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809
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Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809
Get Book Here
Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080922007
Category : Technology & Engineering
Languages : en
Pages : 971
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Book Description
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
Author: Hubert Kaeslin
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
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Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author: Miron Abramovici
Publisher: Wiley-IEEE Press
ISBN: 9780780310629
Category : Technology & Engineering
Languages : en
Pages : 672
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Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Author: Hubert Kaeslin
Publisher: Morgan Kaufmann
ISBN: 0128007729
Category : Technology & Engineering
Languages : en
Pages : 599
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Book Description
Top-Down VLSI Design: From Architectures to Gate-Level Circuits and FPGAs represents a unique approach to learning digital design. Developed from more than 20 years teaching circuit design, Doctor Kaeslin's approach follows the natural VLSI design flow and makes circuit design accessible for professionals with a background in systems engineering or digital signal processing. It begins with hardware architecture and promotes a system-level view, first considering the type of intended application and letting that guide your design choices. Doctor Kaeslin presents modern considerations for handling circuit complexity, throughput, and energy efficiency while preserving functionality. The book focuses on application-specific integrated circuits (ASICs), which along with FPGAs are increasingly used to develop products with applications in telecommunications, IT security, biomedical, automotive, and computer vision industries. Topics include field-programmable logic, algorithms, verification, modeling hardware, synchronous clocking, and more. - Demonstrates a top-down approach to digital VLSI design. - Provides a systematic overview of architecture optimization techniques. - Features a chapter on field-programmable logic devices, their technologies and architectures. - Includes checklists, hints, and warnings for various design situations. - Emphasizes design flows that do not overlook important action items and which include alternative options when planning the development of microelectronic circuits.
Author: Paul H. Bardell
Publisher: Wiley-Interscience
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
Author: M. Michael Vai
Publisher: CRC Press
ISBN: 1351990659
Category : Technology & Engineering
Languages : en
Pages : 424
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Book Description
Very Large Scale Integration (VLSI) has become a necessity rather than a specialization for electrical and computer engineers. This unique text provides Engineering and Computer Science students with a comprehensive study of the subject, covering VLSI from basic design techniques to working principles of physical design automation tools to leading edge application-specific array processors. Beginning with CMOS design, the author describes VLSI design from the viewpoint of a digital circuit engineer. He develops physical pictures for CMOS circuits and demonstrates the top-down design methodology using two design projects - a microprocessor and a field programmable gate array. The author then discusses VLSI testing and dedicates an entire chapter to the working principles, strengths, and weaknesses of ubiquitous physical design tools. Finally, he unveils the frontiers of VLSI. He emphasizes its use as a tool to develop innovative algorithms and architecture to solve previously intractable problems. VLSI Design answers not only the question of "what is VLSI," but also shows how to use VLSI. It provides graduate and upper level undergraduate students with a complete and congregated view of VLSI engineering.
Author: Sanjay Churiwala
Publisher: Springer Science & Business Media
ISBN: 1441992960
Category : Technology & Engineering
Languages : en
Pages : 192
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Book Description
Since register transfer level (RTL) design is less about being a bright engineer, and more about knowing the downstream implications of your work, this book explains the impact of design decisions taken that may give rise later in the product lifecycle to issues related to testability, data synchronization across clock domains, synthesizability, power consumption, routability, etc., all which are a function of the way the RTL was originally written. Readers will benefit from a highly practical approach to the fundamentals of these topics, and will be given clear guidance regarding necessary safeguards to observe during RTL design.
Author: Peter J. Ashenden
Publisher: Morgan Kaufmann
ISBN: 0080568858
Category : Technology & Engineering
Languages : en
Pages : 933
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Book Description
VHDL, the IEEE standard hardware description language for describing digital electronic systems, has recently been revised. The Designer's Guide to VHDL has become a standard in the industry for learning the features of VHDL and using it to verify hardware designs. This third edition is the first comprehensive book on the market to address the new features of VHDL-2008. - First comprehensive book on VHDL to incorporate all new features of VHDL-2008, the latest release of the VHDL standard - Helps readers get up to speed quickly with new features of the new standard - Presents a structured guide to the modeling facilities offered by VHDL - Shows how VHDL functions to help design digital systems - Includes extensive case studies and source code used to develop testbenches and case study examples - Helps readers gain maximum facility with VHDL for design of digital systems
