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Author: Shojiro Asai
Publisher: Springer
ISBN: 4431565949
Category : Technology & Engineering
Languages : en
Pages : 792
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Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Author: Shojiro Asai
Publisher: Springer
ISBN: 4431565949
Category : Technology & Engineering
Languages : en
Pages : 792
Get Book Here
Book Description
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Author: Michael Nicolaidis
Publisher: Springer Science & Business Media
ISBN: 1475760698
Category : Technology & Engineering
Languages : en
Pages : 152
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Book Description
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Author: Stuart Anderson
Publisher: Springer Science & Business Media
ISBN: 3540201262
Category : Business & Economics
Languages : en
Pages : 444
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Book Description
This book constitutes the refereed proceedings of the 22nd International Conference on Computer Safety, Reliability and Security, SAFECOMP 2003, held in Edinburgh, UK in September 2003. The 30 revised full papers presented together with two keynote talk abstracts were carefully reviewed and selected from 96 submissions. The papers are organized in topical sections on formal methods, design for dependability, security and formal methods, dependability and performance analysis, dependability of medical systems, fault tolerance, tools for dependable design, dependability of critical infrastructures, hazard and safety analysis, and design for dependability.
Author: Salvador Bracho del Pino
Publisher: Ed. Universidad de Cantabria
ISBN: 9788481023114
Category : Technology & Engineering
Languages : en
Pages : 756
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Book Description
Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
Author: Management Association, Information Resources
Publisher: IGI Global
ISBN: 1466651261
Category : Technology & Engineering
Languages : en
Pages : 1654
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Book Description
Over the past few decades, devices and technologies have been significantly miniaturized from one generation to the next, providing far more potential in a much smaller package. The smallest of these recently developed tools are miniscule enough to be invisible to the naked eye. Nanotechnology: Concepts, Methodologies, Tools, and Applications describes some of the latest advances in microscopic technologies in fields as diverse as biochemistry, materials science, medicine, and electronics. Through its investigation of theories, applications, and new developments in the nanotechnology field, this impressive reference source will serve as a valuable tool for researchers, engineers, academics, and students alike.
Author: Flammini, Francesco
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
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Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Author: Jürgen Gausemeier
Publisher: Springer Science & Business Media
ISBN: 3642537421
Category : Technology & Engineering
Languages : en
Pages : 206
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Book Description
Intelligent technical systems, which combine mechanical, electrical and software engineering with methods from control engineering and advanced mathematics, go far beyond the state of the art in mechatronics and open up fascinating perspectives. Among these systems are so-called self-optimizing systems, which are able to adapt their behavior autonomously and flexibly to changing operating conditions. The Collaborative Research Center 614 "Self-optimizing concepts and structures in mechanical engineering" pursued the long-term aim to enable others to develop dependable self-optimizing systems. Assuring their dependability poses new challenges. However, self-optimization also offers the possibility to adapt the system's behavior to improve dependability during operation. The aim of this book is to provide methods and techniques to master the challenges and to exploit the possibilities given by self-optimization. The reader will be able to develop self-optimizing systems that fulfill and surpass today’s dependability requirements easily. This book is directed to researchers and practitioners alike. It gives a brief introduction to the holistic development approach for self-optimizing mechatronic systems and the steps required to assure a dependable product design starting with the very early conceptual design phase. A guideline to select suitable methods for each step and the methods themselves are included. Each method is individually introduced, many examples and full references are given.
Author: Allen B. Tucker
Publisher: CRC Press
ISBN: 0203494458
Category : Computers
Languages : en
Pages : 2742
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Book Description
When you think about how far and fast computer science has progressed in recent years, it's not hard to conclude that a seven-year old handbook may fall a little short of the kind of reference today's computer scientists, software engineers, and IT professionals need. With a broadened scope, more emphasis on applied computing, and more than 70 chap
Author: A. Avizienis
Publisher: Springer Science & Business Media
ISBN: 3709188717
Category : Computers
Languages : en
Pages : 467
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Book Description
For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
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Book Description
