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Author: D.F. Barbe
Publisher: Springer Science & Business Media
ISBN: 3662010038
Category : Technology & Engineering
Languages : en
Pages : 291
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Book Description
Even elementary school students of today know that electronics can do fan tastic things. Electronic calculators make arithmetic easy. An electronic box connected to your TV set provides a wonderful array of games. Electron ic boxes can translate languages! Electronics has even changed watches from a pair of hands to a set of digits. Integrated circuit (IC) chips which use transistors to store information in binary form and perform bin ary arithmetic make all of this possible. In just a short twenty years the field of integrated circuits has progressed from a few transistors per chip to thousands of transistors per chip. Since the early 1960's, the field has progressed from chips containing several transistors performing simple functions such as OR and AND functions to chips presently available which contain thousands of transistors performing a wide range of memory, control and arithmetic functions. The number of special journal issues, conferences, workshops, seminars, etc. related to the field of IC's is large. l~hile no single volume could adequately summarize the field, this volume attempts to provide a summary of some of the important issues and factors for Very Large Scale Integra tion (VLSI) from the perspective of several authors deeply involved in the field. In the field of VLSI, composed of many facets and disciplines, the de mand for engineers, physicists and chemists trained in IC skills exceeds supply.
Author: D.F. Barbe
Publisher: Springer Science & Business Media
ISBN: 3662010038
Category : Technology & Engineering
Languages : en
Pages : 291
Get Book Here
Book Description
Even elementary school students of today know that electronics can do fan tastic things. Electronic calculators make arithmetic easy. An electronic box connected to your TV set provides a wonderful array of games. Electron ic boxes can translate languages! Electronics has even changed watches from a pair of hands to a set of digits. Integrated circuit (IC) chips which use transistors to store information in binary form and perform bin ary arithmetic make all of this possible. In just a short twenty years the field of integrated circuits has progressed from a few transistors per chip to thousands of transistors per chip. Since the early 1960's, the field has progressed from chips containing several transistors performing simple functions such as OR and AND functions to chips presently available which contain thousands of transistors performing a wide range of memory, control and arithmetic functions. The number of special journal issues, conferences, workshops, seminars, etc. related to the field of IC's is large. l~hile no single volume could adequately summarize the field, this volume attempts to provide a summary of some of the important issues and factors for Very Large Scale Integra tion (VLSI) from the perspective of several authors deeply involved in the field. In the field of VLSI, composed of many facets and disciplines, the de mand for engineers, physicists and chemists trained in IC skills exceeds supply.
Author: Mohsen Raji
Publisher: Springer Nature
ISBN: 3031153456
Category : Technology & Engineering
Languages : en
Pages : 113
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Book Description
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Author: Kim Ho Yeap
Publisher: BoD – Books on Demand
ISBN: 9535138634
Category : Technology & Engineering
Languages : en
Pages : 161
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Book Description
In this book, a variety of topics related to Very-Large-Scale Integration (VLSI) is extensively discussed. The topics encompass the physics of VLSI transistors, the process of integrated chip design and fabrication and the applications of VLSI devices. It is intended to provide information on the latest advancement of VLSI technology to researchers, physicists as well as engineers working in the field of semiconductor manufacturing and VLSI design.
Author: Patrick O'Connor
Publisher: John Wiley & Sons
ISBN: 047097981X
Category : Technology & Engineering
Languages : en
Pages : 518
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Book Description
With emphasis on practical aspects of engineering, this bestseller has gained worldwide recognition through progressive editions as the essential reliability textbook. This fifth edition retains the unique balanced mixture of reliability theory and applications, thoroughly updated with the latest industry best practices. Practical Reliability Engineering fulfils the requirements of the Certified Reliability Engineer curriculum of the American Society for Quality (ASQ). Each chapter is supported by practice questions, and a solutions manual is available to course tutors via the companion website. Enhanced coverage of mathematics of reliability, physics of failure, graphical and software methods of failure data analysis, reliability prediction and modelling, design for reliability and safety as well as management and economics of reliability programmes ensures continued relevance to all quality assurance and reliability courses. Notable additions include: New chapters on applications of Monte Carlo simulation methods and reliability demonstration methods. Software applications of statistical methods, including probability plotting and a wider use of common software tools. More detailed descriptions of reliability prediction methods. Comprehensive treatment of accelerated test data analysis and warranty data analysis. Revised and expanded end-of-chapter tutorial sections to advance students’ practical knowledge. The fifth edition will appeal to a wide range of readers from college students to seasoned engineering professionals involved in the design, development, manufacture and maintenance of reliable engineering products and systems. www.wiley.com/go/oconnor_reliability5
Author: Behnam Ghavami
Publisher: Springer Nature
ISBN: 3030516105
Category : Technology & Engineering
Languages : en
Pages : 114
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Book Description
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Author: R. Bryant
Publisher: Springer Science & Business Media
ISBN: 3642954324
Category : Technology & Engineering
Languages : en
Pages : 435
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Book Description
The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silicon Structures Project. This conference focused on the role of systematic methodologies, theoretical models, and algorithms in all phases of the design, verification, and testing of very large scale integrated circuits. The need for such disciplines has arisen as a result of the rapid progress of integrated circuit technology over the past 10 years. This progress has been driven largely by the fabrica tion technology, providing the capability to manufacture very complex elec tronic systems reliably and at low cost. At this point the capability to manufac ture very large scale integrated circuits has exceeded our capability to develop new product designs quickly, reliably, and at a reasonable cost. As a result new designs are undertaken only if the production volume will be large enough to amortize high design costs, products first appear on the market well past their announced delivery date, and reference manuals must be amended to document design flaws. Recent research in universities and in private industry has created an emerg ing science of very large scale integration.
Author: Thomas J. Drozda
Publisher: Society of Manufacturing Engineers
ISBN: 0872634027
Category : Technology & Engineering
Languages : en
Pages : 679
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Book Description
Addresses important topics of DFM, including how it relates to concurrent engineering, management issues, getting started in DFM, how to justify using DFM, applying quality tools and how DFM is affecting computer technology (and vice versa). Covers topics starting with the creative thinking process, to combining DFM with geometric dimensioning and tolerancing. Also includes product design information that designers should know when committing pen to paper or mouse to mat.
Author: Library of Congress
Publisher:
ISBN:
Category : Subject headings, Library of Congress
Languages : en
Pages : 1480
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Book Description
Author: Young Kinh-Nhue Truong
Publisher: BoD – Books on Demand
ISBN: 1789232503
Category : Computers
Languages : en
Pages : 162
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Book Description
Splines provide a significant tool for the design of computationally economical curves and surfaces for the construction of various objects like automobiles, ship hulls, airplane fuselages and wings, propeller blades, shoe insoles, bottles, etc. It also contributes in the description of geological, physical, statistical, and even medical phenomena. Spline methods have proven to be indispensable in a variety of modern industries, including computer vision, robotics, signal and image processing, visualization, textile, graphic designs, and even media. This book aims to provide a valuable source on splines and their applications. It focuses on collecting and disseminating information in various disciplines including computer-aided geometric design, computer graphics, data visualization, data fitting, power systems, clinical and epidemiologic studies, disease detection, regression curves, social media, and biological studies. The book is useful for researchers, scientists, practitioners, and many others who seek state-of-the-art techniques and applications using splines. It is also useful for undergraduate senior students as well as graduate students in the areas of computer science, engineering, health science, statistics, and mathematics. Each chapter also provides useful information on software developments and their extensions.
Author:
Publisher:
ISBN:
Category : Naval research
Languages : en
Pages : 620
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Book Description
